TFT Substrate Layered Electrodes and Aluminum Oxide Intermediary

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Solution Overview

Problem

The existing TFT substrates for liquid crystal displays face issues with film floating of insulating films on transparent conductive films, interface reaction between oxide semiconductor films and metal electrodes, and high interface resistance, which affect the performance and reliability of the TFTs, particularly in FFS systems requiring high transmittance and wide viewing angles.

Innovation Solution

A TFT substrate design with a gate electrode and auxiliary capacitance electrode on a substrate, featuring a semiconductor film electrically connected to both surfaces of the source and drain electrodes, and a layered structure of source and drain electrodes to reduce interface resistance and prevent film floating, using oxide semiconductors like InGaZnO for high mobility and stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If oxide semiconductor film is used for high mobility, then device performance is improved, but interface reaction with metal electrodes occurs causing high interface resistance

Engineering Contradiction:
Improvecarrier mobilityVSAvoidinterface resistance
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

An aluminum oxide insulating film is introduced as an intermediary layer between the oxide semiconductor film and the source/drain electrodes. This intermediary layer prevents direct contact and interface reaction between the oxide semiconductor and metal electrodes, thereby reducing interface resistance while maintaining the high mobility benefits of oxide semiconductors.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If insulating film is formed on transparent conductive film, then device structure is completed, but film floating occurs reducing reliability

Engineering Contradiction:
Improvedevice structure completionVSAvoidfilm floating
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The aluminum oxide insulating film is formed preliminarily on the transparent conductive film before forming the oxide semiconductor film. This preliminary anti-action prevents the film floating problem by providing a stable base layer that prevents subsequent films from detaching, thereby ensuring device reliability while maintaining ease of manufacture.

Inventive Principle:
Principle #9Preliminary anti-action

3Ease of manufacture

If oxide semiconductor film is etched selectively, then pattern formation is simplified, but dissolution in acid solution occurs

Engineering Contradiction:
Improvepattern formationVSAvoidmaterial dissolution
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The aluminum oxide insulating film serves as a protective intermediary that prevents the oxide semiconductor film from direct exposure to acid solutions during etching processes. This allows selective etching and pattern formation to proceed while preventing unwanted dissolution of the oxide semiconductor material, maintaining both ease of manufacture and reliability.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS9343487B2Thin film transistor substrate and manufacturing method thereof
Publication Date: 2016.05.17 TRIVALE TECHNOLOGIES LLC
  • US9343487B2 patent drawing
  • US9343487B2 patent drawing
  • US9343487B2 patent drawing

AI summary

A TFT substrate includes a TFT including a source electrode having a lower source electrode and an upper source electrode, which are electrically connected to each other, and a drain electrode having a lower drain electrode and an upper drain electrode, which are electrically connected to each other. The lower source electrode and the lower drain electrode are in contact with a lower surface of the semiconductor film, and the upper source electrode and the upper drain electrode are in contact with an upper surface of the semiconductor film.