Thermal Analysis Design Assist for Substrate Heat Dissipation
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Solution Overview
Problem
Existing design assist systems for thermal analysis of substrates with current detection elements lack the ability to efficiently compare and analyze the heat dissipation characteristics of different current detection elements and substrate configurations.
Innovation Solution
A design assist system that includes a thermal analysis unit, a display unit, and a storage unit, which allows users to input analysis conditions, execute thermal analyses, and display results in a graphical format, enabling comparison of heat dissipation characteristics between different current detection elements and substrate configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If thermal analysis is performed manually without automated comparison tools, then analysis depth can be sufficient, but analysis time and labor cost increase significantly
Solution Approach 1:
The system enables automatic self-comparison of thermal analysis results across multiple substrate configurations. The automated comparison function allows the system to evaluate heat dissipation characteristics of different current detection elements without requiring manual intervention, thereby reducing analysis time while maintaining comprehensive evaluation depth.
Solution Approach 2:
The patent replaces manual thermal analysis procedures with an automated computer-based system. The thermal analysis apparatus automatically calculates temperature distributions, compares heat dissipation characteristics, and generates evaluation results, substituting manual mechanical analysis processes with automated electronic computation.
2Measurement precision
If multiple substrate configurations are analyzed separately, then detailed analysis of each configuration is possible, but overall comparison efficiency decreases
Solution Approach 1:
The system merges multiple thermal analysis results into a unified comparison framework. By integrating temperature distribution data, heat dissipation characteristics, and evaluation criteria into a single automated comparison system, the patent enables simultaneous detailed analysis of multiple substrate configurations with efficient cross-configuration comparison.
Solution Approach 2:
The thermal analysis apparatus is designed with multi-functional capabilities that can handle various substrate configurations and current detection element types. The universal comparison function evaluates different configurations using the same standardized criteria, enabling both detailed individual analysis and efficient overall comparison.
3Productivity
If automated thermal analysis systems are implemented, then analysis speed increases, but system complexity increases
Solution Approach 1:
The system segments the thermal analysis process into distinct functional modules: temperature distribution calculation, heat dissipation characteristic extraction, and comparison evaluation. This modular segmentation reduces overall system complexity by allowing each component to be developed and optimized independently while maintaining high analysis speed through automation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively facilitates the thermal analysis and comparison of substrates with different current detection elements, providing users with insights into heat dissipation behaviors and allowing for optimized design decisions.
Implementation Method 1
heating elements are arranged on a substrate on an arrangement screen, and a temperature distribution on the substrate is calculated according to arrangement positions
Data Source
AI summary
There is provided a design assist apparatus including an inputting unit configured to input an analysis condition including substrate information of a thermal analysis target and current detection element information, and a display control unit configured to control a display unit to display, on the display unit, a thermal analysis result based on the analysis condition, in which the display control unit is configured to control the display unit to display, on the display unit and in a mutually identifiable manner, a first thermal analysis result based on a first analysis condition input by the inputting unit and a second thermal analysis result based on a second analysis condition obtained by changing at least one of the substrate information and the current detection element information from the first analysis condition.


