Thermal Region Tags for Memory Read Performance

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Solution Overview

Problem

Existing electronic memory storage devices face inefficiencies in managing frequent temperature changes, leading to increased resource overhead and read/write latency due to premature closure of blocks during cross-temperature events, especially under high amplitude and frequency temperature variations.

Innovation Solution

The method involves detecting thermal region tags and outliers by measuring temperatures at block opening and closure, assigning blocks to thermal regions based on these measurements, and dynamically managing thermal regions to avoid premature closure and optimize read parameters, thereby reducing resource overhead and improving read performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If blocks are closed prematurely during cross-temperature events, then bit error rate is reduced, but resource overhead increases and read/write latency increases

Engineering Contradiction:
Improvebit error rateVSAvoidresource overhead
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system dynamically adjusts block closure behavior based on real-time temperature monitoring. Instead of fixed premature closure, the system uses thermal region tags to determine when closure is appropriate, allowing flexible adaptation to varying temperature conditions while reducing unnecessary resource consumption

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes the parameter of block closure timing based on temperature range thresholds. By monitoring temperature differences and comparing them against predefined thresholds, the system determines optimal closure timing that balances reliability with resource efficiency

Inventive Principle:
Principle #35Parameter changes

2Reliability

If blocks are closed prematurely during cross-temperature events, then bit error rate is reduced, but read performance deteriorates

Engineering Contradiction:
Improvebit error rateVSAvoidread performance
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system segments blocks into different thermal regions based on temperature conditions. By creating thermal region tags that categorize blocks according to their temperature history, the system can apply different read parameters to different segments, optimizing read performance for each thermal region while maintaining overall reliability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system performs preliminary temperature measurement and thermal region assignment before read operations. By pre-determining which thermal region a block belongs to and assigning appropriate read parameters in advance, the system reduces read latency while ensuring data integrity

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If temperature monitoring is performed frequently, then cross-temperature events are detected accurately, but resource consumption increases

Engineering Contradiction:
Improvetemperature detection accuracyVSAvoidresource consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The system implements feedback by continuously monitoring temperature and using this information to adjust block management decisions. Temperature measurements feed back into the decision-making process for block closure and read parameter selection, enabling accurate detection while optimizing resource usage through intelligent feedback-driven control

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS20220011967A1Thermal region tags and thermal region outlier detection
Publication Date: 2022.01.13 SANDISK TECHNOLOGIES LLC
  • US20220011967A1 patent drawing
  • US20220011967A1 patent drawing
  • US20220011967A1 patent drawing

AI summary

A method, device, and system for improving read performance in frequently changing device temperature conditions through detecting thermal region tags and thermal region outliers in a memory device. A plurality of thermal regions may be configured for the memory device. A first temperature may be measured corresponding to opening a storage block of the memory device for programming. A second temperature may then be measured corresponding to closing the storage block for programming. A range between the first temperature and the second temperature may be determined. The range may span N≥2 of the thermal regions. Finally, the storage block may be assigned to a thermal region that includes the second temperature, on condition that N satisfies a threshold.