Thermal Vias in IC Package with Embedded Die

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Solution Overview

Problem

Conventional thermal management in system-in-package technology faces challenges in efficiently removing heat from integrated circuit packages due to limitations in heat escape pathways through the die, underfill, and package substrate materials.

Innovation Solution

The implementation of thermal vias in the package substrate with a cross-sectional shape resembling the union of overlapping circles, coupled with copper plating on the die's thermal hotspots, provides an efficient thermal path to package contacts, enhancing heat dissipation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If conventional thermal management with standard thermal vias is used, then heat can be removed from the die, but the thermal pathways are insufficient and heat dissipation efficiency is limited

Engineering Contradiction:
Improveheat dissipation efficiencyVSAvoidthermal pathway complexity
Core Design Contradiction:
TemperatureVSDevice complexity

Solution Approach 1:

The thermal via structure is segmented into multiple components: copper plating layers on the die surface, thermal via holes through the substrate, and thermal pads on the opposite side. This segmentation allows each component to optimize heat transfer in its specific zone, improving overall thermal management efficiency

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Copper plating is applied locally at thermal hotspot areas on the die surface rather than uniformly across the entire die. This local quality approach concentrates thermal conduction capacity where heat generation is highest, maximizing heat dissipation efficiency while minimizing material usage and structural complexity

Inventive Principle:
Principle #3Local quality

2Temperature

If thermal vias are concentrated at hotspots with copper plating, then heat transfer is enhanced, but manufacturing precision requirements increase

Engineering Contradiction:
Improvethermal conduction efficiencyVSAvoidvia placement precision
Core Design Contradiction:
TemperatureVSManufacturing precision

Solution Approach 1:

Copper plating is applied to the die surface before the die is mounted in the package substrate. This preliminary action allows the thermal hotspots to be identified and addressed during die preparation, enabling precise via placement at hotspot locations while maintaining standard manufacturing tolerances in subsequent assembly steps

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The copper plating process itself serves dual purposes: it provides electrical connectivity and creates the thermal conduction pathway. The plating naturally follows the contour of the die surface and bonding pads, self-aligning the thermal via locations to optimal positions without requiring additional alignment steps

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution creates an effective thermal pathway for heat to escape from the die to package contacts, improving thermal management and reducing thermal stress by concentrating vias at hotspots and using conductive materials like copper for enhanced heat transfer.

Implementation Method 1

copper plating on the die's thermal hotspots, provides an efficient thermal path to package contacts, enhancing heat dissipation

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS8633597B2Thermal vias in an integrated circuit package with an embedded die
Publication Date: 2014.01.21 QUALCOMM INC
  • US8633597B2 patent drawing
  • US8633597B2 patent drawing
  • US8633597B2 patent drawing

AI summary

In a multi-module integrated circuit package having a package substrate and package contacts, a die is embedded in the package substrate with thermal vias that couple hotspots on the embedded die to some of the package contacts.