Thickness Measurement Device Decoupling Precision from Movement

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Solution Overview

Problem

Conventional height measurement devices require multiple instruments or precise movement to measure multiple points with high precision, which is impractical due to the limitations of the movement device's operating precision.

Innovation Solution

A thickness measurement device with a chassis, a distance measurement instrument capable of measuring in two opposite directions, and an arithmetic unit that calculates the difference in total distances measured with and without the measurement object, allowing for precise thickness calculation regardless of the movement mechanism's precision.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple measurement instruments or precise movement devices are used to measure multiple height measurement points with high precision, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improveheight measurement precisionVSAvoidnumber of measurement instruments or movement mechanism complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement process is segmented into two distinct measurement phases: first measuring the distance from the measurement instrument to the installation surface, then measuring the distance from the measurement instrument to the measurement object. By segmenting the measurement into these two independent phases and calculating the difference, the system achieves high measurement precision without requiring multiple instruments or complex movement mechanisms.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system performs a preliminary measurement of the distance from the measurement instrument to the installation surface before measuring the distance to the measurement object. This preliminary action establishes a reference value that is then used in the final thickness calculation, eliminating the need for complex movement mechanisms and enabling high-precision measurement with a single instrument.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If a movement device with high operating precision is used to position the measurement instrument at multiple measurement points, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improvethickness measurement precisionVSAvoidmovement mechanism precision requirements
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system replaces the need for a highly-precise mechanical movement device with an optical measurement approach. By using a measurement instrument that directly measures distances optically and calculating thickness through arithmetic operations on measured values, the system achieves high measurement precision without relying on mechanical movement precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system changes the measurement parameter from direct thickness measurement to indirect measurement through distance difference calculation. By measuring the distance from the installation surface to the measurement instrument and from the measurement object to the measurement instrument, then calculating the difference, the system achieves high precision without requiring precise mechanical positioning.

Inventive Principle:
Principle #35Parameter changes

3Adaptability or versatility

If the measurement instrument is moved to different positions for measuring multiple measurement points, then comprehensive measurement coverage is improved, but measurement precision deteriorates due to movement device limitations

Engineering Contradiction:
Improvemeasurement point coverageVSAvoidthickness measurement precision
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The measurement instrument is designed with universal applicability to measure multiple different positions and measurement points. By maintaining the same measurement instrument for all measurement points and using consistent measurement methodology (distance difference calculation), the system achieves both comprehensive measurement coverage and high measurement precision without being limited by movement device precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables high-precision thickness measurement of objects by decoupling the distance measurement precision from the movement mechanism's precision, allowing for accurate calculations even with low-precision movement devices.

Implementation Method 1

a distance measurement instrument that can measure the distances to objects in two opposite directions

Methodology Applied
Scientific EffectOptical distance measurement: LIDAR

Data Source

PatentUS10151578B2Thickness measurement device and thickness measurement method
Publication Date: 2018.12.11 FANUC LTD
  • US10151578B2 patent drawing
  • US10151578B2 patent drawing
  • US10151578B2 patent drawing

AI summary

A thickness measurement device includes a chassis provided with an installation surface on which a measurement object is installed and a facing surface disposed parallel to the installation surface with a gap therebetween. A distance measurement instrument measures the distances to objects in two opposite directions. A movement mechanism positions the distance measurement instrument at a measurement point between the installation surface and the facing surface such that the measurement directions thereof are aligned with the direction along the gap between the installation surface and the facing surface. An arithmetic unit calculates the difference between the total of the distances measured at the measurement point in a state in which the measurement object is not installed on the installation surface and the total of the distances measured in a state in which the measurement object is installed on the installation surface.