3D Reconstruction of Thin Film Samples Without Staining

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Solution Overview

Problem

Transmission electron microscopes struggle to capture high-contrast images of thin film samples containing light elements like hydrogen, carbon, and oxygen, as staining can alter the sample's structure and lead to misinterpretation.

Innovation Solution

A 3D reconstruction method using a scanning transmission electron microscope (STEM) and processor to capture images at multiple angles, perform preprocessing, alignment, and iterative algorithms to generate high-resolution 3D images without the need for staining, by shifting and rotating images to minimize pixel errors and using discrete Fourier transforms.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If staining is applied to enhance image contrast, then image contrast is improved, but sample structural integrity deteriorates

Engineering Contradiction:
Improveimage contrastVSAvoidsample structural integrity
Core Design Contradiction:
Illumination intensityVSStability of the object's composition

Solution Approach 1:

The patent transitions from 2D imaging to 3D reconstruction by capturing images at multiple tilt angles and reconstructing the sample volume. This dimensional transition enables high-contrast imaging of light elements through tomographic reconstruction without requiring staining, as the 3D information provides enhanced contrast through density and structural variations rather than chemical staining.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the imaging parameters by using a wide range of tilt angles (from -60 degrees to +60 degrees in 5-degree increments) and multiple acceleration voltages. This parameter variation enables the detection of light elements through their scattering properties at different angles without requiring staining, thereby maintaining sample integrity while achieving high contrast.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If multiple images at different angles are captured for 3D reconstruction, then image resolution and accuracy are improved, but measurement time increases

Engineering Contradiction:
Improve3D reconstruction accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent performs preliminary alignment and registration of images at different tilt angles before reconstruction. By pre-aligning the images using the known geometric relationships from the tilt series, the reconstruction process is accelerated and accuracy is maintained without requiring excessive numbers of images.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent employs iterative reconstruction algorithms that use feedback from the reconstructed images to refine the alignment and reconstruction parameters. This feedback mechanism allows the system to achieve high precision with fewer images by continuously optimizing the reconstruction based on the accumulated data.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method produces high-resolution 3D images of thin film samples without structural changes, enhancing image quality and eliminating the need for staining, thus preventing potential sample alterations.

Implementation Method 1

When using a transmission electron microscope to capture an image of a thin film sample

Methodology Applied
Scientific EffectElectron beam transmission: Electron Beam

Implementation Method 2

generating an initial 3D data distribution in reciprocal space based on the aligned 2D images that respectively correspond to the N number of different angles by using discrete Fourier transform and interpolation

Methodology Applied
Scientific EffectFourier transform:

Data Source

PatentUS11830122B23D reconstruction method and 3D reconstruction system
Publication Date: 2023.11.28 NATIONAL TSING HUA UNIVERSITY
  • US11830122B2 patent drawing
  • US11830122B2 patent drawing
  • US11830122B2 patent drawing

AI summary

A 3D reconstruction method for a thin film sample that includes a light element is provided. The method includes performing preprocessing that includes noise removal, field-of-view correction and background subtraction on original projection images captured by a scanning transmission electron microscope to obtain 2D images, performing several rounds of a 3D reconstruction procedure that includes an alignment process and an iterative algorithm based on the 2D images and reference images to obtain a piece of reconstructed 3D image data, generating a reconstructed 3D image related to the thin film sample based on the piece of reconstructed 3D image data, and displaying the reconstructed 3D image.