Thin Film Encapsulation Clusters for Flexible Display Lifespan

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Solution Overview

Problem

Existing thin film encapsulation methods for flexible display devices face challenges in uniformly adjusting the thicknesses of organic and inorganic layers and maintaining consistent vacuum pressures during deposition, which can affect the lifespan and performance of flexible display devices.

Innovation Solution

A manufacturing apparatus comprising multiple clusters for forming inorganic and organic layers using sputtering, monomer deposition, and chemical vapor deposition processes, with controlled passage chambers and turn modules to ensure uniform pressure and inverted substrate handling for alternating layer deposition.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple thin films are stacked to encapsulate the light emitting unit, then the lifespan of the flexible display device is improved, but the manufacturing complexity and difficulty of controlling uniform thickness increase

Engineering Contradiction:
Improvelifespan of flexible display deviceVSAvoidmanufacturing complexity of encapsulation process
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The encapsulation process is divided into multiple clusters (first cluster for inorganic layer, second cluster for organic layer, third cluster for inorganic layer) with distinct functions. Each cluster handles specific layer deposition independently, allowing for specialized process control and simplified manufacturing of each individual layer while achieving comprehensive encapsulation protection

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Passage chambers serve as intermediary components that connect the different clusters and maintain vacuum pressure uniformity across the system. These intermediary chambers enable smooth transition of substrates between processing stages while preserving the required vacuum environment, thus managing the complexity of multi-layer deposition

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If vacuum pressures are not maintained uniformly during deposition, then the deposition process becomes simpler, but the thickness control precision of the layers deteriorates

Engineering Contradiction:
Improvethickness control precision of layersVSAvoidvacuum pressure control system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The system maintains equipotential vacuum pressure conditions across all clusters and passage chambers by controlling the internal pressures to be substantially the same. This uniform pressure distribution ensures consistent deposition conditions throughout the manufacturing process, enabling precise thickness control of all encapsulation layers

Inventive Principle:
Principle #12Equipotentiality

Solution Approach 2:

The vacuum pressure control system incorporates feedback mechanisms that monitor and adjust the internal pressures of clusters and passage chambers in real-time. This feedback control ensures that pressure deviations are corrected promptly, maintaining the precision required for uniform layer thickness deposition

Inventive Principle:
Principle #23Feedback

3Manufacturing precision

If conventional deposition methods are used for organic and inorganic layers, then the process is simpler, but the ability to adjust thicknesses of different layers independently is reduced

Engineering Contradiction:
Improveindependent thickness adjustment of layersVSAvoidease of layer deposition process
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The deposition process is segmented into separate clusters for organic and inorganic layers, with the second cluster dedicated to organic layer deposition using monomer deposition and the first/third clusters for inorganic layers using sputtering or CVD. This segmentation enables independent thickness adjustment of each layer type while maintaining manufacturing efficiency through specialized process optimization in each cluster

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system enables independent thickness control by allowing parameter changes specific to each layer type and deposition method. The organic layer thickness can be adjusted through monomer deposition parameters in the second cluster, while inorganic layer thickness is controlled through sputtering or CVD parameters in the first and third clusters, providing flexible and precise thickness management

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for precise control of layer thicknesses and uniform vacuum pressures, enhancing the lifespan and performance of flexible display devices by ensuring consistent and efficient encapsulation.

Implementation Method 1

a first cluster configured to form a first inorganic layer on a display substrate using a sputtering process

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 2

a second cluster configured to form a first organic layer on the first inorganic layer on the display substrate using a monomer deposition process

Methodology Applied
Scientific EffectMonomer deposition: Physical Vapour Deposition

Implementation Method 3

a third cluster configured to form a second inorganic layer on the first organic layer on the display substrate using a chemical vapor deposition (CVD) process or a plasma enhanced chemical vapor deposition (PECVD) process

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Implementation Method 4

a third cluster configured to form a second inorganic layer on the first organic layer on the display substrate using a chemical vapor deposition (CVD) process or a plasma enhanced chemical vapor deposition (PECVD) process

Methodology Applied
Scientific EffectPlasma enhanced chemical vapor deposition: Plasma Enhanced Chemical Vapour Deposition

Data Source

PatentEP4033559A1Apparatus and method for manufacturing thin film encapsulation
Publication Date: 2022.07.27 SAMSUNG DISPLAY CO LTD
  • EP4033559A1 patent drawingFigure 1~2
  • EP4033559A1 patent drawingFigure 3~4
  • EP4033559A1 patent drawingFigure 5

AI summary

An apparatus (100) for manufacturing a thin film encapsulation includes: a first cluster (120) configured to form a first inorganic layer on a display substrate using a sputtering process; a second cluster (130) configured to form a first organic layer on the first inorganic layer on the display substrate using a monomer deposition process; and a third cluster (140) configured to form a second inorganic layer on the first organic layer on the display substrate using a chemical vapor deposition (CVD) process or a plasma enhanced chemical vapor deposition (PECVD) process.