Thin-Film Semiconductor Optical Layout for Uniform Current Injection

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Solution Overview

Problem

Conventional thin-film semiconductor optical devices face challenges in expanding the width of the active layer while maintaining strong optical confinement, low element resistance, and uniform carrier distribution, leading to limitations in high power output and non-uniformity of current injection.

Innovation Solution

A semiconductor optical device with a structure that includes a first cladding layer, a first semiconductor layer, an active layer, a second semiconductor layer, a plurality of third semiconductor layers arranged perpendicular to the waveguide direction, and electrodes, allowing for expanded active layer width with high optical confinement and uniform current injection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If the width of the active layer is increased to achieve high power output, then the power output is improved, but the element resistance per volume increases and optical confinement is impaired

Engineering Contradiction:
Improvepower outputVSAvoidoptical confinement
Core Design Contradiction:
PowerVSReliability

Solution Approach 1:

The single first Mesa structure is divided into multiple second Mesas arranged in the width direction. Each second Mesa has a narrow width (400 nm or less) to maintain strong optical confinement, while multiple Mesas in parallel provide sufficient current injection area for high power output. This segmentation resolves the contradiction by allowing the active layer width to be enlarged without increasing the width of individual Mesa structures that control optical confinement.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Instead of increasing the width of a single Mesa in the lateral direction (which would impair optical confinement), the solution transitions to arranging multiple narrow Mesas in the width direction. This dimensional arrangement allows the total current injection area to increase while each individual Mesa maintains the narrow width needed for optical confinement, effectively solving the contradiction through spatial reconfiguration.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Power

If the width of the active layer is increased to achieve high power output, then the power output is improved, but the carrier distribution uniformity deteriorates

Engineering Contradiction:
Improvepower outputVSAvoidcarrier distribution uniformity
Core Design Contradiction:
PowerVSManufacturing precision

Solution Approach 1:

The single current injection path is segmented into multiple independent second Mesa structures distributed across the width of the active layer. Each Mesa provides localized current injection, ensuring uniform carrier distribution across the entire active layer width. This segmentation prevents the non-uniformity problem that occurs with a single wide Mesa or horizontal structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each second Mesa is positioned at specific locations across the width of the active layer to provide localized current injection. This local quality approach ensures that carriers are injected uniformly across the entire width, with each region receiving adequate current supply. The local positioning of multiple Mesas resolves the uniformity issue while enabling high power output across the entire active layer.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The device achieves high optical confinement, low element resistance, and uniform current distribution across the active layer, enabling increased power output and improved carrier extraction.

Implementation Method 1

an optical device having a thin-film structure in which a group III-V semiconductor thin film with a thickness of approximately 200 to 400 nm is surrounded by an insulating material having a low refractive index, such as SiO2 and air

Methodology Applied
Scientific EffectTotal internal reflection: Total Internal Reflection

Data Source

PatentUS20260040717A1Semiconductor Optical Device
Publication Date: 2026.02.05 NT T INC
  • US20260040717A1 patent drawing
  • US20260040717A1 patent drawing
  • US20260040717A1 patent drawing

AI summary

The semiconductor optical device first includes a first cladding layer formed on a substrate, a first semiconductor layer of a first conductivity type formed on the first cladding layer, an active layer formed on the first semiconductor layer, and a second semiconductor layer of an i-type or second conductivity type formed on the active layer in contact with the active layer. The semiconductor optical device also includes a plurality of third semiconductor layers of the second conductivity type formed on the second semiconductor layer.