Thin-Film Resistor Layout Using Shared Bond Pad Patterning

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Solution Overview

Problem

Conventional methods for integrating thin film resistors into integrated circuits require additional lithography and process steps, increasing manufacturing costs and cycle time, posing challenges in their formation.

Innovation Solution

A method for fabricating thin film resistors in integrated circuits that simplifies the process by reducing the number of masks and patterning steps, using a single mask to form the resistor between bond pads, and employing a ceramic coating and photo resist patterning to define the resistor dimensions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional methods are used to integrate thin film resistors into integrated circuits, then the resistors can be formed with proper dimensions and properties, but additional lithography steps and process steps are required, increasing manufacturing complexity and cycle time

Engineering Contradiction:
Improveresistor dimension precisionVSAvoidfabrication process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent combines the resistor formation process with the existing bond pad formation process by using a single lithography step to pattern both structures. The resistive material is deposited over the entire area including bond pads, then a single photoresist pattern is used to define both the bond pads and the thin film resistor simultaneously, eliminating the need for separate lithography steps.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The single lithography step serves multiple functions: it defines the bond pad geometry, defines the thin film resistor geometry, and creates the pattern for subsequent etching steps. This multi-functional approach replaces what would traditionally require separate patterning steps for each structure.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Manufacturing precision

If conventional methods are used to integrate thin film resistors into integrated circuits, then the resistors can be formed with proper dimensions and properties, but additional lithography steps and process steps are required, increasing manufacturing cycle time

Engineering Contradiction:
Improveresistor dimension precisionVSAvoidmanufacturing cycle time
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent combines the resistor formation process with the existing bond pad formation process by using a single lithography step to pattern both structures. The resistive material is deposited over the entire area including bond pads, then a single photoresist pattern is used to define both the bond pads and the thin film resistor simultaneously, eliminating the need for separate lithography steps.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The resistive material is deposited beforehand over the entire area where both bond pads and resistors will be formed, before the single lithography step. This preliminary deposition allows the subsequent single patterning step to define both structures without requiring additional material deposition steps later in the process.

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If conventional methods are used to integrate thin film resistors into integrated circuits, then the resistors can be formed with proper dimensions and properties, but additional lithography steps and process steps are required, increasing manufacturing costs

Engineering Contradiction:
Improveresistor dimension precisionVSAvoidmanufacturing cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent combines the resistor formation process with the existing bond pad formation process by using a single lithography step to pattern both structures. The resistive material is deposited over the entire area including bond pads, then a single photoresist pattern is used to define both the bond pads and the thin film resistor simultaneously, eliminating the need for separate lithography steps.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The single lithography step serves multiple functions: it defines the bond pad geometry, defines the thin film resistor geometry, and creates the pattern for subsequent etching steps. This multi-functional approach replaces what would traditionally require separate patterning steps for each structure.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces manufacturing complexity and costs by streamlining the fabrication process, allowing for efficient integration of thin film resistors with fewer additional steps compared to conventional techniques.

Implementation Method 1

employing a ceramic coating and photo resist patterning to define the resistor dimensions

Methodology Applied
Scientific EffectPhotolithography: Photography

Implementation Method 2

forming a ceramic coating over the thin film resistive material

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS20240047510A1Integrated circuit with thin film resister structure
Publication Date: 2024.02.08 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240047510A1 patent drawing
  • US20240047510A1 patent drawing
  • US20240047510A1 patent drawing

AI summary

A fabrication method includes: forming, over a first dielectric layer between a first metal portion and a second metal portion, a thin film resistor (TFR); forming openings in the first dielectric layer over the first metal portion and the second metal portion; and forming a first bond pad in an opening over the first metal portion and a second bond pad in an opening over the second metal portion; wherein the first dielectric layer is disposed between the first bond pad and the second bond pad, the TFR is formed over the first dielectric layer between the first bond pad and the second bond pad, the TFR has an electrical connection at a first end to the first bond pad and an electrical connection at a second end to the second bond pad, and the TFR provides a resistive path between the first bond pad and the second bond path.