Automatic Thin Section Sample Preparation Device with Image Verification
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing automatic thin section sample preparation devices require manual visual collation to verify if the thin section is correctly cut from the embedding block, leading to potential specimen mix-ups and reduced automation benefits, especially when processing large quantities.
Innovation Solution
An automatic device that reads ID data from the embedding block and images both the block and thin section surfaces, using image processing to determine if the thin section is accurately cut, storing the results for easy verification and reducing operator burden.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual visual collation is performed by operator to verify thin section cutting accuracy, then collation accuracy can be maintained, but operator burden increases and specimen mix-up risk increases especially when processing large quantities
Solution Approach 1:
The patent replaces the manual visual collation process with an automated image processing system. The determination portion uses image recognition algorithms to automatically compare the embedding block image with the thin section image, substituting the operator's visual inspection with computational image analysis. This eliminates operator burden while maintaining collation accuracy through consistent automated processing.
Solution Approach 2:
The patent creates digital copies (images) of both the embedding block surface and the thin section surface. These image copies are then processed and compared by the determination portion to verify cutting accuracy. By working with image copies rather than physical specimens, the system enables automated verification without increasing operator burden.
2Productivity
If automatic thin-cutting device processes large quantities of embedding blocks, then productivity increases, but specimen mix-up risk increases due to increased operator burden
Solution Approach 1:
The patent implements an automated feedback mechanism where the determination portion continuously verifies each thin section's correspondence to its source embedding block. The system provides immediate confirmation or correction feedback, ensuring specimen identification accuracy even when processing large quantities. This automated feedback loop prevents specimen mix-up by verifying each cutting operation's accuracy.
Solution Approach 2:
The patent replaces manual verification processes with automated image processing and determination algorithms. This substitution enables the system to maintain high specimen identification accuracy while processing large quantities of embedding blocks, as the automated system does not suffer from operator fatigue or oversight that plagues manual verification during high-volume processing.
3Device complexity
If only ID data is printed on slide glass without image verification, then device complexity remains low, but ability to verify collation operation is insufficient
Solution Approach 1:
The patent creates and processes digital image copies of the embedding block and thin section surfaces. These image copies enable precise collation verification by allowing the determination portion to compare visual features, patterns, and characteristics. This image-based verification provides superior collation accuracy compared to ID data alone, while the image processing occurs automatically without adding significant operational complexity.
Solution Approach 2:
The patent introduces image processing as an intermediary between the cutting operation and the final verification. The image captures serve as intermediaries that bridge the physical specimens and the determination system, enabling accurate collation verification. This intermediary layer enhances verification capability while maintaining system simplicity through automated processing.
Data Source
Figure 1~2
Figure 3
Figure 4~7
AI summary
Provided is an automatic thin section sample preparation device (1) including: a reading portion (20) which reads the ID data; a first imaging portion (27) which images a surface image of an embedding block (B); a sample preparation mechanism (50) which prepares a thin section (M) by thinly cutting the embedding block, fixes the thin section to a substrate (G), and prepares a thin section sample (H); a second imaging portion (34) which images a thin section image of the thin section in the thin section sample; a recording portion (35) which records individual data on the substrate in the thin section sample; and a control portion (12). The control portion includes a determination portion (12b) which determines whether or not the thin section is prepared from an original embedding block by collating the surface image and the thin section image, and a storage portion (12c) which stores the determination result from the determination portion in association with the ID data, as the individual data.