Threshold-Programmed Word Lines for NAND Sub-Block Access

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Solution Overview

Problem

As NAND memory blocks increase in size and density, accessing less than all of the block, such as a sub-block or subset of the blocks, is challenging due to processing difficulties with independently biasable select gates, particularly at the source side of three-dimensional NAND structures.

Innovation Solution

Implementing word line based selectors where multiple word lines are programmed with different sets of threshold voltages to allow individual access of sub-blocks, reducing read disturbs and power consumption while avoiding processing difficulties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If independently biasable select gates are used to access sub-blocks, then sub-block access capability is improved, but processing difficulty increases

Engineering Contradiction:
Improvesub-block access capabilityVSAvoidprocessing difficulty
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The patent combines the select gate functionality with existing word lines by programming multiple threshold voltage states into the same word line structure. This merging eliminates the need for separate independently biasable select gates, thereby maintaining sub-block access capability while avoiding the processing difficulties associated with additional gate structures.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The word lines are designed to serve multiple functions: they act as both data access lines and sub-block selection lines. By programming different threshold voltage states into the word lines, they can selectively enable or disable access to different sub-blocks, providing universal functionality that replaces dedicated select gates.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If traditional select gate structures are used, then sub-block separation is achieved, but read disturbances increase

Engineering Contradiction:
Improvesub-block separationVSAvoidread disturbances
Core Design Contradiction:
Adaptability or versatilityVSObject-affected harmful factors

Solution Approach 1:

The patent replaces the physical select gate structure with an electrical field-based selection mechanism. By applying specific voltage levels to word lines with different threshold voltages, sub-block selection is achieved through electrical control rather than physical gate structures, thereby reducing read disturbances to non-selected cells.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Quantity of substance

If higher density NAND memory blocks are used, then storage capacity is improved, but access control to sub-blocks becomes more difficult

Engineering Contradiction:
Improvestorage capacityVSAvoidaccess control difficulty
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The patent utilizes parameter changes in the word line threshold voltages to achieve sub-block access control in high-density NAND memory. By programming word lines with distinct threshold voltage values, the system can selectively activate or deactivate access to different sub-blocks, maintaining ease of access control despite increased storage capacity and density.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient access to sub-blocks in NAND memory, reducing read disturbances and power consumption, and increasing operating speeds without the processing challenges of traditional select gate structures.

Implementation Method 1

multiple word lines are programmed with different sets of threshold voltages to allow individual access of sub-blocks

Methodology Applied
Scientific EffectThreshold voltage:

Data Source

PatentUS12437817B2Sub-block separation in NAND memory through word line based selectors
Publication Date: 2025.10.07 SANDISK TECHNOLOGIES LLC
  • US12437817B2 patent drawing
  • US12437817B2 patent drawing
  • US12437817B2 patent drawing

AI summary

As block sizes in NAND memory continue to increase in size and density, in can be useful to access less than all of the block, such as sub-block or subset of the blocks NAND strings, in order to reduce read disturbs, reduce power consumption, and increase operating speeds. Although this sort of separation of sub-block can be achieved by independently biasable select gates, the sort of select gate structure can face processing difficulties, particularly at the source side of three dimensional NAND structures. To avoid these difficulties while still providing individually selectable sub-blocks, the following introduces word line based selectors, where multiple word lines of a blocks are programmed with different sets of threshold voltages, allowing them to be biased for individual access of sub-blocks.