Through-Mold Cooling Channel for Stacked Die Heat Dissipation

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Solution Overview

Problem

Vertically stacked semiconductor dies face challenges in heat dissipation, leading to increased operating temperatures due to the difficulty in effectively transferring heat away from the densely packed packages.

Innovation Solution

Incorporation of a through-mold cooling channel within the package casing, utilizing a thermal conductor and dielectric fluid to facilitate heat transfer from the semiconductor dies to the ambient environment through an immersion cooling system, with features like vias, channels, and condensers to enhance heat dissipation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple semiconductor dies are vertically stacked to increase processing power without increasing package footprint, then the functional capacity of the package is improved, but heat dissipation becomes difficult and operating temperatures increase

Engineering Contradiction:
Improveprocessing powerVSAvoidoperating temperature
Core Design Contradiction:
ProductivityVSTemperature

Solution Approach 1:

The package is segmented into multiple functional layers: semiconductor dies for processing, thermal interface material for heat transfer, vapor chamber for heat dissipation, and condensers for heat removal. This segmentation allows each component to specialize in a specific thermal management function, effectively resolving the heat dissipation challenge of vertically stacked dies

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A thermal interface material acts as an intermediary between the semiconductor dies and the vapor chamber, facilitating efficient heat transfer from the dies to the cooling structure. This intermediary component bridges the thermal gap and enables effective heat removal from the densely stacked dies

Inventive Principle:
Principle #24Intermediary (Mediator)

2Area of stationary object

If vertically stacked packages are used to increase functional capacity, then the package footprint is reduced, but heat dissipation pathways are limited

Engineering Contradiction:
Improvepackage footprintVSAvoidheat dissipation efficiency
Core Design Contradiction:
Area of stationary objectVSLoss of energy

Solution Approach 1:

The invention transitions from two-dimensional heat dissipation (lateral heat paths on die surface) to three-dimensional heat dissipation by introducing vertical heat pathways through the vapor chamber and condensers. This dimensional change enables heat to be removed from the bottom of the package, bypassing the footprint constraint and providing additional thermal management capacity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively reduces the operating temperatures of semiconductor dies by efficiently transferring heat away from the package, maintaining electrical integrity while preventing thermal interference.

Implementation Method 1

The via includes a thermal conductor that thermally couples the peripheral region of the first die with the cover

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

utilizing a thermal conductor and dielectric fluid to facilitate heat transfer from the semiconductor dies to the ambient environment through an immersion cooling system

Methodology Applied
Scientific EffectConvection: Convection

Implementation Method 3

with features like vias, channels, and condensers to enhance heat dissipation

Methodology Applied
Scientific EffectCondensation: Condensation

Data Source

PatentEP3469628B1Semiconductor device assembly with through-mold cooling channel
Publication Date: 2024.02.14 MICRON TECHNOLOGY INC
  • EP3469628B1 patent drawingFigure 1A~1B
  • EP3469628B1 patent drawingFigure 2~3
  • EP3469628B1 patent drawingFigure 4~5

AI summary

Semiconductor device assemblies having stacked semiconductor dies and thermal transfer devices that include vapor chambers are disclosed herein. In one embodiment, a semiconductor device assembly includes a first semiconductor die having a base region, at least one second semiconductor die at the base region, and a thermal transfer device attached to the first and second dies. The thermal transfer device includes an encapsulant at least partially surrounding the second die and a via formed in the encapsulant. The encapsulant at least partially defines a cooling channel that is adjacent to a peripheral region of the first die. The via includes a working fluid and/or a solid thermal conductor that at least partially fills the channel.