Differential Test Probe With Tilted Tips For Slipping Prevention
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Solution Overview
Problem
Current high bandwidth differential test probes are difficult to use for measuring high frequency signals due to slipping issues, leading to measurement errors and potential device damage.
Innovation Solution
A differential test probe with tilted probe tips and adjustable coaxial connectors, combined with discrete resistors, spring members, and isolating caps, to facilitate ergonomic handling and prevent slipping, while allowing for accurate measurements at frequencies greater than 6 GHz.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the probe tips are arranged parallel to the rotational axes, then the differential test probe can measure high bandwidth differential signals, but the probe tips easily slip off from the measuring points due to required hand-held position
Solution Approach 1:
The patent applies asymmetry by tilting the probe tips at specific angles (first tilt angle and second tilt angle, both not equal to zero) relative to the plane containing the rotational axes. This asymmetric arrangement creates an ergonomic hand-held position that prevents the probe tips from slipping off the measuring points while maintaining measurement accuracy for high bandwidth differential signals.
2Reliability
If the probe tips are tilted at non-zero angles, then the probe prevents slipping and ensures accurate measurements, but the device complexity increases due to additional tilt angle adjustments
Solution Approach 1:
The patent implements dynamics by making the probe tips adjustable in their tilt angles. The first and second tilt angles can be independently adjusted to accommodate different measuring point configurations. This dynamic adjustability allows the probe to adapt to various device geometries while maintaining stability and preventing slipping, without requiring a completely complex fixed structure.
3Ease of operation
If the tilt angles are made equal, then the ergonomic handling is further improved, but the adaptability to varying device geometries is reduced
Solution Approach 1:
The patent maintains dynamic adjustability for both tilt angles, allowing them to be set equally for improved ergonomics when needed, or differently when adapting to specific device geometries. This dynamic capability enables the probe to switch between optimized handling modes and adaptive measurement modes as required.
Solution Approach 2:
The patent achieves universality by designing the probe with independent adjustment mechanisms for both tilt angles, enabling the same probe structure to serve multiple functions: ergonomic standardized measurements with equal angles and adaptive measurements with different angles for varying device geometries.
Data Source
AI summary
A high bandwidth differential test probe for measuring a device under test is provided. The test probe comprises a first probe tip arranged at a first coaxial connector relative to a first rotational axis, and a second probe tip arranged at a second coaxial connector relative to a second rotational axis. For adjusting the distance between the first probe tip and the second probe tip, the first coaxial connector is rotatable with respect to the first rotational axis and the second coaxial connector is rotatable with respect to the second rotational axis. Additionally, a tilt angle between the first probe tip and a plane comprising both the first and second rotational axes, and a tilt angle between the second probe tip and the plane, is not equal to zero.