Tilting Radiation Detector Support for SEM X-Ray Analysis

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Solution Overview

Problem

Scanning electron microscopes face challenges in detecting X-rays at varying working distances due to interference from pole pieces and reduced detection accuracy, requiring multiple X-ray detectors which increase cost and size.

Innovation Solution

A radiation analyzer with a support system that allows the tilt of the radiation detector's center axis to be adjusted relative to the optical axis, enabling the detection of X-rays at different take-off angles using a single detector by changing the working distance and take-off angle, thus preventing interference and optimizing detection efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the working distance is reduced to increase resolution, then the resolution is improved, but X-ray detection is blocked by the pole piece

Engineering Contradiction:
ImproveresolutionVSAvoidX-ray blocking by pole piece
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The support structure enables dynamic adjustment of the radiation detector's tilt angle relative to the optical axis. By making the detector position adjustable rather than fixed, the system can adapt to different working distances - tilting at smaller angles for short working distances to avoid pole piece blocking, and at larger angles for long working distances to optimize detection accuracy.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If multiple X-ray detectors are provided to detect X-rays at different take-off angles, then detection accuracy at varying working distances is improved, but device cost and size increase

Engineering Contradiction:
ImproveX-ray detection accuracyVSAvoidnumber of detectors
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A single radiation detector is designed with multi-functionality through an adjustable support structure. The detector can be tilted to different angles to serve multiple detection purposes - detecting X-rays at appropriate take-off angles for both short and long working distances, replacing the need for multiple fixed-angle detectors.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The support structure provides dynamic positioning capability, allowing one detector to assume multiple functional roles by adjusting its tilt angle. This dynamic adjustment enables a single detector to replace what would otherwise require multiple static detectors at different positions and angles.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient X-ray detection across different working distances without the need for multiple detectors, reducing device size and cost while maintaining high detection accuracy.

Implementation Method 1

a primary ray source that generates primary rays

Methodology Applied
Scientific EffectElectron beam generation: Electron Beam

Implementation Method 2

an optical system that applies the primary rays emitted from the primary ray source to a sample

Methodology Applied
Scientific EffectElectromagnetic lens focusing: Electromagnetic Induction

Implementation Method 3

an energy-dispersive radiation detector that detects radiation that has been generated from the sample

Methodology Applied
Scientific EffectX-ray detection: X-Ray

Implementation Method 4

energy-dispersive radiation detector

Methodology Applied
Scientific EffectEnergy dispersive detection: Photoelectric Effect

Data Source

PatentUS9536701B2Radiation analyzer including a support for tilting an energy-dispersive radiation detector
Publication Date: 2017.01.03 JEOL LTD
  • US9536701B2 patent drawing
  • US9536701B2 patent drawing
  • US9536701B2 patent drawing

AI summary

A radiation analyzer includes a primary ray source that generates primary rays, an optical system applies the primary rays emitted from the primary ray source to a sample, an energy-dispersive radiation detector that detects radiation that has been generated from the sample when the primary rays have been applied to the sample, and a support that supports the radiation detector so that the tilt of the center axis (C) of the radiation detector with respect to the optical axis (Z) of the optical system can be changed.