Time-to-Digital Pressure Sensing Circuit for Compact SoC Integration
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional voltage-to-digital converting circuits are unsuitable for highly integrated System-on-the-Chip (SoC) applications due to their large size and susceptibility to external noise, as they require significant voltage generation capacity and are analog-based.
Innovation Solution
A time-to-digital converting circuit that varies the delay time difference between a reference signal and a sensing signal in response to external stimulus strength, generating digital data corresponding to this difference, thereby reducing size and minimizing noise sensitivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a voltage-to-digital converting circuit is used to convert sensor output voltage to digital data, then the circuit can recognize voltage magnitude, but the circuit size becomes large and it requires significant voltage generation capacity
Solution Approach 1:
The patent replaces the voltage-based measurement system with a time-based measurement system. Instead of measuring voltage magnitude directly, the circuit converts the sensor signal into a time delay measurement by comparing the timing of a sensing signal with a reference signal. This substitution of measurement domain (from voltage to time) enables digital conversion without requiring large voltage generation circuits, thus reducing overall circuit size while maintaining measurement precision.
Solution Approach 2:
The patent changes the measurement parameter from voltage magnitude to time delay. By measuring the time difference between a reference signal and a sensing signal that has been delayed by an RC circuit, the system achieves digital conversion functionality without needing the complex voltage generation and amplification infrastructure, thereby reducing circuit area.
2Measurement precision
If a voltage-to-digital converting circuit with sufficient voltage generation capacity is used, then the A/D converter can correctly recognize voltage magnitude, but the circuit becomes susceptible to external noise and performance degrades
Solution Approach 1:
The patent replaces the voltage measurement system with a time measurement system. By converting the analog signal into a time delay measurement through RC circuits and comparing it with a reference signal in the time domain, the system achieves digital conversion without requiring high-voltage generation circuits that are susceptible to noise, thus improving noise immunity while maintaining measurement accuracy.
Solution Approach 2:
The patent introduces RC delay circuits as intermediary elements that transform the sensor voltage signal into a time-delayed signal. This intermediary transformation allows the measurement to be performed in the time domain rather than the voltage domain, eliminating the need for high-voltage generation circuits and reducing susceptibility to external noise while preserving measurement precision.
3Reliability
If the voltage generation unit generates sufficient voltage magnitude for signal amplification and A/D conversion, then the circuit operates correctly, but the device size increases making it unsuitable for highly integrated SoC applications
Solution Approach 1:
The patent replaces the voltage generation and amplification system with a time-based measurement system using RC delay circuits. By measuring time delays instead of voltage magnitudes, the system eliminates the need for large voltage generation units and signal amplification stages, enabling correct circuit operation with significantly reduced device size suitable for highly integrated SoC applications.
Solution Approach 2:
The patent changes the fundamental measurement parameter from voltage to time. This parameter transformation allows the circuit to achieve reliable operation through time delay measurement and comparison, eliminating the requirement for high-voltage generation capacity and reducing the overall device area to make it suitable for system-on-chip integration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The time-to-digital converting circuit achieves a significant reduction in size and enhances noise resistance, making it suitable for highly integrated SoC applications without the need for large voltage generation capabilities.
Implementation Method 1
a variable delay unit varying a delay time in response to an impedance of an externally applied signal
Data Source
AI summary
A time-to-digital converting circuit and a pressure sensing device using the same are provided. The circuit includes: a delay time-varying unit generating a reference signal having a fixed delay time, and a sensing signal having a variable delay time in response to an impedance of an externally applied signal; and a delay time calculation and data generation unit calculating a delay time difference between the reference signal and the sensing signal, and generating digital data having a value corresponding to the calculated delay time difference. Accordingly, the digital data are generated using the delay time varied in response to the externally applied signal, so that the size of the time-to-digital circuit is significantly reduced. In addition, an affect due to external noises is minimized.