Timepiece Vibration Testing With Floating Clamping for Wafer Measurements
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Solution Overview
Problem
Existing vibration testing devices for silicon balance springs attached to a silicon wafer are inefficient in quickly and reliably testing all parts on the same wafer.
Innovation Solution
A vibration testing device with floating clamping means and secondary guide means allows for multiple measurements on a silicon wafer by enabling movement of the clamped wafer to different positions without unclamping, using a positioning device to guide and move the wafer in orthogonal directions and a holding device with clamping means that provide freedom of movement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the silicon wafer is clamped firmly to eliminate parasitic vibrations, then measurement reliability is improved, but the wafer cannot be moved to different positions for multiple measurements
Solution Approach 1:
The clamping means are made floating with degrees of freedom that allow dynamic adjustment. The clamping means can move relative to the positioning device along guide means, enabling the system to adapt between firmly clamping the wafer for reliable measurements and allowing position changes for multiple measurements without unclamping.
2Adaptability or versatility
If the wafer is unclamped and repositioned for each measurement, then positioning flexibility is improved, but parasitic vibrations increase and measurement reliability deteriorates
Solution Approach 1:
The floating clamping means with guide means enable dynamic repositioning while maintaining clamping contact. The system can move the clamped wafer to different positions along the guide means without unclamping, thus preserving both positioning flexibility and measurement reliability through continuous stable contact.
3Reliability
If multiple measurements are taken at different positions, then testing completeness is improved, but testing time increases
Solution Approach 1:
The floating clamping means allow continuous measurement operations at multiple positions without interrupting the clamping state. The wafer can be moved along the guide means to different measurement positions while remaining clamped, enabling continuous testing across multiple positions without the time loss associated with repeated unclamping and repositioning operations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and reliable testing of all silicon parts on a wafer by minimizing parasitic vibrations and maintaining consistent clamping conditions, allowing multiple measurements without unclamping, thus simplifying the testing process and reducing damage risk.
Implementation Method 1
a source of vibrational excitation, arranged to excite the timepiece
Implementation Method 2
a measuring device arranged to measure a vibrational response of the timepiece
Data Source
Figure 1
Figure 2~3
AI summary
Testing device for testing a timepiece (20), comprising: - a source of vibration excitation (30), - a measuring device (40) for measuring a vibration response, - a positioning device (50), with main guide means (55), arranged to place the timepiece (20) in a first position, - a holding device with clamping means (200) for clamping the timepiece (20) in the first position, characterized in that the clamping means (200) are floating, the holding device comprising secondary guide means (100), arranged to provide at least one degree of freedom to the clamping means (200), to allow movement to place the timepiece (20) in at least a second position.