Total Internal Reflection Microscope Illumination Angle Control
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Solution Overview
Problem
Conventional total internal reflection microscopes face challenges in achieving precise control over illumination angle due to the high cost and limited availability of high-resolution detection elements, which affects the observation image and evanescent field penetration depth.
Innovation Solution
A total internal reflection microscope with an illumination optical system, an incident angle adjustment part, an optical detector, and a controller that determines the operation amount of the incident angle adjustment part based on the change in intensity of the returning light, allowing for precise control of the illumination angle and evanescent field penetration depth.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-resolution detection elements are used to improve position detection precision of illumination light, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent replaces the mechanical/optical detection system (CCD or PSD) with an electrical measurement system. Instead of detecting the position of illumination light optically, the system measures the electrical signal from the piezoelectric element that directly corresponds to the incident angle, achieving equivalent measurement precision through electrical means.
Solution Approach 2:
The patent introduces a piezoelectric element as an intermediary between the illumination light path and the detection system. This piezoelectric element converts mechanical displacement related to incident angle into an electrical signal, serving as a mediator that simplifies the overall detection system while maintaining measurement precision.
2Measurement precision
If projection magnification is increased to improve position detection precision, then measurement precision is improved, but device complexity and size increase
Solution Approach 1:
The patent eliminates the need for complex optical projection systems by replacing optical magnification with direct electrical measurement. The piezoelectric element provides a direct electrical signal proportional to the incident angle, removing the requirement for high projection magnification optical systems.
Solution Approach 2:
The patent extracts the essential measurement function from the complex optical projection system. By using the piezoelectric element to directly sense and electrically report the incident angle, the system removes the intermediate optical projection components that would otherwise be necessary for achieving high measurement precision.
3Measurement precision
If detection element size is increased to accommodate higher projection magnification, then measurement precision is improved, but cost increases
Solution Approach 1:
The patent replaces expensive large-size detection elements with a compact piezoelectric sensor. The piezoelectric element provides direct electrical measurement of incident angle without requiring large optical detection elements, significantly reducing manufacturing cost while maintaining measurement precision.
Solution Approach 2:
The patent employs a relatively simple and inexpensive piezoelectric element instead of costly high-resolution detection elements. This substitution uses a more affordable component that achieves the same measurement function, reducing overall system cost.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise control of the illumination angle with a simple configuration, improving detection precision and reducing costs by using a more affordable detection system.
Implementation Method 1
an illumination optical system for relaying light from a light source with a relay optical system and forming an image of the light source on the incident pupil of an objective lens
Implementation Method 2
a total internal reflection microscope including an incident angle adjustment part for changing the position of the image of the light source in a direction orthogonal to the optical axis
Implementation Method 3
an optical detector for detecting intensity of the returning light that is the light reflected by the sample and collected by the objective lens
Data Source
AI summary
The total internal reflection microscope has an illumination optical system that relays light from a light source with a relay optical system, forms an image of the light source on the incident pupil plane of the objective lens and irradiates a sample with the illumination light via an objective lens, has an angle adjustment mirror for changing the position of the image of the light source in a direction orthogonal to the optical axis, an optical detector for detecting the intensity of the returning illumination light reflected by the sample and collected by the objective lens, and a controller for determining the operation amount of the angle adjustment mirror, wherein the controller determines the operation amount of the angle adjustment mirror so that the illumination light is totally reflected at the sample based on the change in intensity of the returning light when the angle adjustment mirror is changed.