TIRF Microscopy Multi-Wavelength Dispersion

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Solution Overview

Problem

Conventional TIRF microscopy systems face challenges in simultaneously imaging multiple wavelengths due to wavelength-dependent critical angles, leading to inconsistent penetration depths and increased mechanical complexity, which complicates the alignment and requires additional mechanical systems for adjusting focal points.

Innovation Solution

An adjustable dispersive device with a single or dual optical flats provides controlled chromatic dispersion to distribute focal spots of multiple light beams across the back focal plane, allowing for desired angles of incidence and depths of evanescent waves, enabling simultaneous imaging of multiple wavelengths with closely matched penetration depths without requiring precise knowledge of optical properties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If conventional TIRF microscopy systems use multiple wavelengths for imaging, then imaging versatility is improved, but wavelength-dependent critical angles cause inconsistent penetration depths and increased device complexity

Engineering Contradiction:
Improvemulti-wavelength imaging capabilityVSAvoidmechanical systems for adjusting focal points
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent replaces mechanical adjustment systems with an adjustable dispersive device (acousto-optic modulator or liquid crystal device) that controls chromatic dispersion electronically. This substitutes complex mechanical focal point adjustment with an optical field-based dispersive element, reducing mechanical complexity while enabling multi-wavelength imaging with controlled penetration depths

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the dispersion parameter of the optical system by adjusting the dispersive device to compensate for wavelength-dependent critical angles. By dynamically modifying the chromatic dispersion parameter, the system maintains consistent penetration depths across multiple wavelengths without requiring mechanical repositioning of focal points

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If conventional TIRF systems adjust focal points for each wavelength, then penetration depth consistency is improved, but alignment complexity and mechanical requirements increase

Engineering Contradiction:
Improvepenetration depth consistencyVSAvoidalignment and mechanical systems
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent eliminates mechanical focal point adjustment mechanisms by introducing an adjustable dispersive device that controls the angular separation of wavelengths. This optical field-based approach replaces mechanical alignment systems, achieving penetration depth consistency through optical dispersion control rather than mechanical repositioning

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an adjustable dispersive device as an intermediary element in the optical path between the light source and the sample. This mediator controls chromatic dispersion to achieve consistent penetration depths, eliminating the need for direct mechanical adjustment of focal points for each wavelength

Inventive Principle:
Principle #24Intermediary (Mediator)

3Area of stationary object

If TIRF microscopy uses a broad cone of light for illumination, then imaging coverage is improved, but spatial resolution and signal-to-background ratio deteriorate

Engineering Contradiction:
Improveillumination coverage areaVSAvoidspatial resolution
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

The patent applies local quality by using TIRF illumination to create a localized evanescent field at the coverslip-sample interface. Instead of uniform broad illumination, the evanescent wave provides exponentially decaying intensity localized within ~100nm of the interface, improving signal-to-background ratio while maintaining coverage of the interface region

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the illumination into two distinct regions: the evanescent field region near the interface that provides high-resolution imaging, and the bulk sample region that remains unilluminated. This segmentation eliminates out-of-focus background fluorescence while preserving interface imaging quality

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution allows for simultaneous multi-wavelength imaging with reduced wavelength-related differences in penetration depths, minimizing mechanical complexity and alignment issues, and enabling imaging across a range of desired depths without needing prior knowledge of optical properties.

Implementation Method 1

total internal reflection fluorescence (TIRF) microscopy employs the unique properties of an induced evanescent wave to selectively illuminate and excite fluorophores in a restricted specimen region immediately adjacent to a glass-water (or glass-buffer) interface

Methodology Applied
Scientific EffectTotal internal reflection: Total Internal Reflection

Implementation Method 2

An adjustable dispersive device with a single or dual optical flats provides controlled chromatic dispersion to distribute focal spots of multiple light beams across the back focal plane

Methodology Applied
Scientific EffectChromatic dispersion: Dispersion (of waves)

Implementation Method 3

An adjustable dispersive device with a single or dual optical flats provides controlled chromatic dispersion

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentEP2720075B1Total internal reflectance fluorescence (TIRF) microscopy across multiple wavelengths simultaneously
Publication Date: 2017.11.29 SPECTRAL APPLIED RES
  • EP2720075B1 patent drawingFigure 1
  • EP2720075B1 patent drawingFigure 2
  • EP2720075B1 patent drawingFigure 3

AI summary

A multiple wavelength total internal reflection fluoresence 'TIRF' microscopy system has an objective (304). A dispersion unit (350,650) of the system comprises a high-dispersion optical element (354,654). The dispersion unit receives illumination light having at least a first wavelength » 1 and a second wavelength » 2 , where » 1 ‰  » 2 , and splits the illumination light into a first monochromatic beam having the first wavelength » 1 and a second monochromatic beam having the second wavelength » 2 . The monochromatic beams are focused onto a back focal plane (306) of the objective, near an outer edge of the objective, at different radial distances from an optical axis (346) of the objective. The dispersion unit is rotatable in order to adjust angles of incidence of the monochromatic beams onto an interface (316) between a substrate (312) and a sample (314) to be imaged, wherein the angles of incidence are greater than the critical angle of the interface.