Titanium Sputtering Target Grain Control via Knead Forging

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Solution Overview

Problem

Conventional titanium targets used for sputtering struggle with maintaining a dense, columnar crystal structure and uniformity, leading to issues with electromigration resistance and sputtering film uniformity, especially as semiconductor elements require smaller crystal grain sizes and randomized crystal orientations to enhance performance.

Innovation Solution

A manufacturing method involving multiple knead forging and heat treatment processes to produce a titanium sputtering target with a purity of 99.99% or more, achieving a crystal grain size of 15 μm or less and random crystal orientation, which suppresses ghost grains and maintains stability and uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the titanium target is made large in size to match large silicon wafers, then the sputtering area is increased, but the controllability of crystal grain size and orientation becomes difficult

Engineering Contradiction:
Improvesputtering target areaVSAvoidcrystal grain size control
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent divides the large titanium target into multiple smaller targets arranged in an array. Each small target maintains controlled crystal grain structure and orientation, while collectively they provide the necessary large sputtering area. This segmentation allows precise control of crystal properties in each unit without the difficulties associated with manufacturing large single-piece targets.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the size parameter of individual targets from large to small, while compensating by increasing the number of targets. This parameter transformation enables maintaining crystal grain size control and orientation precision while achieving the required total sputtering area through multiple controlled units rather than one large uncontrolled target.

Inventive Principle:
Principle #35Parameter changes

2Strength

If the titanium target thickness is increased to 8 mm or more to match large silicon wafers, then the mechanical strength is improved, but the uniformity of sputtering film becomes difficult to control

Engineering Contradiction:
Improvetarget mechanical strengthVSAvoidsputtering film uniformity
Core Design Contradiction:
StrengthVSManufacturing precision

Solution Approach 1:

The patent segments the thick target structure into multiple thinner targets arranged in an array. Each thin target maintains uniform crystal orientation and grain size, ensuring uniform sputtering film deposition. The collective array provides the necessary mechanical strength while individual targets maintain the precision required for uniform film control, avoiding the uniformity problems of thick single-piece targets.

Inventive Principle:
Principle #1Segmentation

3Device complexity

If conventional sputtering targets are used without specialized manufacturing processes, then the manufacturing complexity is reduced, but the electromigration resistance and film uniformity deteriorate

Engineering Contradiction:
Improvemanufacturing process complexityVSAvoidelectromigration resistance
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies preliminary cold forging and heat treatment processes to each titanium target before assembly. These preliminary actions create the desired columnar crystal structure with controlled grain size and random orientation, which are essential for electromigration resistance. By performing these actions in advance on each unit target, the complex manufacturing is distributed across multiple simple, controlled operations rather than one complex process.

Inventive Principle:
Principle #10Preliminary action

4Manufacturing precision

If the crystal grain size is reduced to enhance sputtering film quality, then the film uniformity is improved, but the manufacturing precision requirements become more stringent

Engineering Contradiction:
Improvesputtering film uniformityVSAvoidmanufacturing process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the manufacturing into multiple independent unit targets, each undergoing controlled cold forging and heat treatment to achieve fine crystal grain structure. This segmentation allows stringent precision requirements to be met in each small unit through controlled processes, rather than attempting to control grain size across a large single target where precision control becomes difficult.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the approach from attempting to control crystal grain size in a single large target to controlling grain size in multiple small targets. This parameter transformation enables achieving fine crystal grains (15 μm or less) with random orientation and uniform structure, as each small target can be precisely controlled through standardized cold forging and heat treatment processes.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method results in a sputtering target with improved electromigration resistance and uniform deposition, suitable for producing high-reliability titanium nitride films for semiconductor elements, maintaining performance even in large targets and over extended sputtering times.

Implementation Method 1

one set is cold forging processes in directions parallel to and perpendicular to a thickness direction of the titanium material

Methodology Applied
Scientific EffectCold-forming: Cold-forming

Implementation Method 2

a first heat treatment process in which the titanium material passing through the first knead forging process is heated to a temperature of 700° C. or more to induce recrystallization

Methodology Applied
Scientific EffectHeat treatment: Heat Treatment

Implementation Method 3

heated to a temperature of 700° C. or more to induce recrystallization

Methodology Applied
Scientific EffectRecrystallization: Crystallisation

Implementation Method 4

a cold rolling process in which cold rolling is performed for the titanium material passing through the second knead forging process

Methodology Applied
Scientific EffectCold-forming: Cold-forming

Implementation Method 5

a second heat treatment process in which the titanium material passing through the cold rolling process is heated to a temperature of 300° C. or more to perform a heat treatment

Methodology Applied
Scientific EffectHeat treatment: Heat Treatment

Implementation Method 6

The TiN film is obtained by sputtering a sputtering target made up of, for example, high-purity Ti in a nitrogen atmosphere

Methodology Applied
Scientific EffectSputtering: Sputtering

Data Source

PatentUSRE47788E1Sputtering target, manufacturing method thereof, and manufacturing method of semiconductor element
Publication Date: 2019.12.31 NITERRA MATERIALS CO LTD
  • USRE47788E1 patent drawing
  • USRE47788E1 patent drawing

AI summary

According to an embodiment, two or more sets of knead forging are performed where one set is cold forging processes in directions parallel to and perpendicular to a thickness direction of a columnar titanium material. The titanium material is heated to a temperature of 700° C. or more to induce recrystallization, and thereafter, two or more sets of knead forging are performed where one set is the cold forging processes in the directions parallel to and perpendicular to the thickness direction. Further, the titanium material is cold rolled, and is heat-treated to a temperature of 300° C. or more.