TLP Calibration Using Segmented Resistance Correction
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Solution Overview
Problem
Existing Transmission Line Pulse (TLP) systems face challenges in accurately measuring integrated circuit responses due to errors introduced by voltage and current calibrations during open/short correction procedures, which alter the calibration settings and reduce measurement accuracy.
Innovation Solution
A method for calibrating TLP devices that involves selectively shorting or creating an open circuit within the measurement system to calculate series and shunt resistances, allowing for the application of mathematical algorithms to correct pulse current and voltage values without altering the voltage and current calibrations, using formulas such as RS=Vms*Ims and RSH=Vmo/Imo, and subsequently calculating corrected ic and vc values using specific coefficients.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If open circuit and short circuit test loads are used to correct measurement distortions, then measurement accuracy is improved, but voltage and current calibrations are altered
Solution Approach 1:
The correction process is segmented into separate calculations for series resistance (RS) and shunt resistance (RSH) using independent open circuit and short circuit measurements. This allows the correction factors to be determined without affecting the voltage and current calibrations, as each correction parameter is calculated independently from dedicated test loads.
Solution Approach 2:
Known test loads (open circuit and short circuit loads) serve as intermediaries to determine correction factors. These test loads are not part of the normal measurement path but are used specifically to calculate RS and RSH values, which then serve as correction mediators applied to actual DUT measurements without altering the calibration settings.
2Measurement precision
If correction factors are applied to raw data, then measurement accuracy is improved, but system complexity increases
Solution Approach 1:
The correction factors (RS and RSH) are calculated in advance using separate open circuit and short circuit measurements before actual device testing. These pre-calculated correction factors are then applied to the raw measurement data through straightforward mathematical operations, avoiding the need for complex real-time correction algorithms during normal operation.
Solution Approach 2:
The system uses its own measurement capabilities to determine correction factors by performing self-diagnostic tests with known open circuit and short circuit loads. This self-calibration approach eliminates the need for external calibration equipment or complex correction systems, as the TLP device measures and corrects its own measurement errors using built-in test functions.
Data Source
AI summary
A transmission Line Pulse (TLP) device calibration method wherein the TLP device includes a pulse generator for generating a pulse, a cable having an input terminal coupled to said pulse generator, an output terminal, and at least one ground return terminal, for coupling said pulse to a device under test (DUT) when it is connected to said output terminal, and a sensor for sensing the voltage and current at a selected point in said cable to measure the pulsed voltage and current of the DUT as the pulses travel in the cable to and from the DUT. The method for calibrating said TLP device comprises selectively shorting between said output terminal and said ground return terminal and selectively creating an open circuit between these terminals to enable the calculation of the series resistance RS at said selected point in said cable and calculating the shunt resistance RSH at said selected point in said cable, respectively, when a pulse is generated, and for calculating the corrected values of current and voltage according to a formula that uses these resistance values.