TLP Test System Calibration for Transient Waveform Accuracy
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Solution Overview
Problem
Current TLP test systems fail to accurately characterize transient voltage and current waveforms during ESD stress due to system parasitics like probe resistances and lossy transmission line interconnects, requiring costly RF equipment for characterization.
Innovation Solution
A calibration method that uses voltage and current waveforms captured on an open and a known calibration element to determine the transient behavior of the TLP test system, eliminating the need for additional RF equipment by transforming waveforms into the frequency domain and extracting calibration data, which can be integrated into existing TLP software without hardware additions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If RF equipment is used for characterization of transient behaviour, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The TLP test system performs its own calibration using built-in measurement equipment and standard calibration elements (open and short circuits). The system uses its existing voltage and current measurement capabilities to characterize and compensate for parasitics without requiring external RF equipment, making the system self-sufficient for transient waveform accuracy
Solution Approach 2:
The patent introduces calibration elements (open circuit and short circuit) as intermediaries to characterize the test system's parasitics. By measuring the response of these known calibration elements, the system can extract calibration data that compensates for probe resistances, inductances, and transmission line effects, enabling accurate transient measurements without complex RF equipment
2Ease of operation
If calibration is performed using standard calibration elements, then ease of operation is improved, but measurement precision may be compromised
Solution Approach 1:
The patent transforms voltage and current waveforms from the time domain to the frequency domain using Fast Fourier Transform (FFT). This parameter transformation enables the extraction of calibration data that accurately represents the system's parasitic effects across different frequencies, maintaining measurement precision while using simple calibration elements
Solution Approach 2:
The system measures the response of calibration elements, processes this information through FFT analysis, and uses the extracted calibration data to compensate for parasitics in subsequent DUT measurements. This feedback loop ensures that the simple calibration elements yield accurate correction factors for improving transient waveform precision
Data Source
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Figure 3
AI summary
Calibration method for calibrating transient behaviour of a TLP test system. The system comprises a TLP generator, probe needles, nominally impedance matched transmission lines and measurement equipment, connected between the transmission lines and the TLP generator, for detecting transient behaviour of a device under test by simultaneously capturing voltage and current waveforms as a result of generated pulses. The calibration method comprises (a) applying the TLP test system on an open and capturing first voltage and current waveforms; (b) applying the TLP test system on a calibration element having a known finite impedance and a known transient response and capturing second voltage and current waveforms; (c) transforming the captured first and second current and voltage waveforms to the frequency domain, and (d) determining calibration data for the transient behaviour of the TLP test system on the basis of the transformed first and second voltage and current waveforms.