TLP Measurement Using Distributed Sensing Probes

The patent divides the measurement system into multiple sensing probes positioned at different locations along the conductor, each measuring voltage at its specific position. This segmentation allows the system to reconstruct the complete voltage and current waveforms at the device under test by combining measurements from multiple points, thereby achieving both long pulse duration and high measurement precision without requiring probes to be positioned extremely close to the device.

The patent introduces a distributed sensing system along the conductor as an intermediary between the pulse generator and the device under test. This intermediary system provides multiple measurement points that capture voltage and current information throughout the conductor, enabling accurate determination of device response without the need for probe proximity to the device, thus allowing longer pulse durations while maintaining measurement precision.

The patent segments the conductor into multiple measurement sections with sensing probes distributed along its length. Each probe measures voltage at its specific location, and the system reconstructs the complete waveform by combining these segmented measurements. This approach allows the conductor to be sufficiently long for long pulse durations while maintaining measurement precision through distributed sensing rather than relying on a single proximity-based measurement point.

The patent replaces the traditional single-point mechanical proximity measurement system with a distributed sensing system that uses multiple measurement points along the conductor. This substitution eliminates the trade-off between conductor length and measurement precision by using multiple probes to capture voltage and current information throughout the entire conductor, enabling long pulse durations without the measurement errors associated with single-point measurements on long cables.

The patent segments the measurement function across multiple sensing probes distributed along the conductor, each capturing voltage at its location. This segmentation enables the system to achieve high time resolution by measuring voltage at multiple points simultaneously while supporting longer pulse durations because the distributed sensing architecture reduces cable loss effects compared to single-point measurement systems.

The patent creates a universal measurement system that can handle both very short pulses (for high time resolution) and longer pulses (for comprehensive ESD testing) using the same distributed sensing architecture. The multi-functional system uses multiple sensing probes to capture voltage and current information throughout the conductor, making it adaptable to different pulse durations without the cable loss limitations of single-sensor Very Fast TLP systems.