TMD Transistor Structure With Monolayer Channel and Doped Multilayer S/D

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Solution Overview

Problem

The challenge in semiconductor fabrication lies in forming defect-free monolayer transition metal dichalcogenides (TMDs) across large areas and creating adequately conductive source and drain contacts for TMD-based semiconductor devices, as monolayer TMDs have superior electrical properties but are difficult to dope and connect effectively.

Innovation Solution

The approach involves forming transistors with a monolayer TMD channel and multilayer TMD source and drain regions, where the upper layers of the multilayer TMD are doped and the monolayer channel is created by selectively removing layers using atomic layer etching or exfoliation, allowing for fewer defects and improved conductivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If monolayer TMD is used for the entire device including source and drain, then superior electrical properties are achieved, but conductivity of source and drain contacts is insufficient

Engineering Contradiction:
Improveelectrical propertiesVSAvoidconductivity
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent applies different layer configurations to different regions of the TMD device: monolayer TMD is used specifically for the channel region to maintain superior electrical properties, while multilayer TMD is used for the source and drain regions to provide adequate conductivity. This local differentiation resolves the contradiction by optimizing each region for its specific functional requirement.

Inventive Principle:
Principle #3Local quality

2Area of stationary object

If monolayer TMD is formed across large wafer area, then device scalability is improved, but defect formation increases

Engineering Contradiction:
Improvewafer areaVSAvoiddefect-free formation
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent segments the TMD structure into monolayer and multilayer regions, where the multilayer TMD serves as a more defect-tolerant foundation and contact region, while the monolayer channel is formed in controlled areas. This segmentation allows large-area fabrication while maintaining high precision in the critical channel region.

Inventive Principle:
Principle #1Segmentation

3Reliability

If monolayer TMD is used for channel, then electrical properties are superior, but difficulty in doping and connecting increases

Engineering Contradiction:
Improveelectrical propertiesVSAvoiddoping and connection
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent uses multilayer TMD for source and drain regions where doping and connection are required, while maintaining monolayer TMD for the channel where superior electrical properties are needed. The multilayer structure provides easier doping and better mechanical properties for contact formation, resolving the manufacturing difficulty without compromising channel performance.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables the production of TMD-based transistors with reduced defects and enhanced conductivity, overcoming the limitations of monolayer TMDs by utilizing multilayer TMDs for source and drain regions and maintaining the superior electrical properties of monolayer channels.

Implementation Method 1

the monolayer channel is created by selectively removing layers using atomic layer etching or exfoliation

Methodology Applied
Scientific EffectAtomic layer etching:

Implementation Method 2

where the upper layers of the multilayer TMD are doped

Methodology Applied
Scientific EffectDoping: Dopants

Data Source

PatentEP4451339A1Integrated circuits with monolayer TMD channel and multilayer TMD source and drain
Publication Date: 2024.10.23 INTEL CORP
  • EP4451339A1 patent drawingFigure 1
  • EP4451339A1 patent drawingFigure 2
  • EP4451339A1 patent drawingFigure 3A~3B

AI summary

Described herein are transistors with monolayer transition metal dichalcogenides (TMD) semiconductor material. TMD materials include combination of a transition metal (e.g., molybdenum or tungsten) and a chalcogen (e.g., sulfur or selenium) in a monolayer having a hexagonal crystal structure. A transistor has a single layer of TMD forming a channel region, and multiple layers of the TMD material at the source and drain regions. Upper portions of the multilayer TMD source and drain regions are doped, and conductive contacts are formed over the doped portions.