Transition Metal Dichalcogenide Thin Films via Sputtering and Annealing

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Solution Overview

Problem

Current methods face challenges in forming high-quality, uniform transition metal dichalcogenide thin films over large areas efficiently, particularly in achieving scalability and short production time, which is crucial for applications in electronic devices.

Innovation Solution

A method involving a sputtering process to deposit a transition metal dichalcogenide thin film on a substrate at a first temperature, followed by heat-treating it under a chalcogen atmosphere at a higher temperature, allowing for the formation of amorphous or polycrystalline materials with adjustable thickness and uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional methods are used to form transition metal dichalcogenide thin films, then film quality can be maintained, but production time is excessive and large area coverage is difficult

Engineering Contradiction:
Improveproduction timeVSAvoidfilm uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The film formation process is divided into two distinct stages: (1) sputtering deposition at first temperature to form initial film layer, and (2) heat treatment at second temperature under chalcogen atmosphere to complete crystallization. This segmentation allows each stage to be optimized independently, achieving both speed and quality

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The sputtering process performs preliminary film formation at a lower temperature and shorter time, creating a precursor layer that is then completed by heat treatment. This preliminary action reduces the total time required while maintaining film quality through the subsequent crystallization step

Inventive Principle:
Principle #10Preliminary action

2Productivity

If sputtering process is used to deposit thin film rapidly, then production time is reduced, but film quality and uniformity may be compromised

Engineering Contradiction:
Improvedeposition speedVSAvoidfilm quality
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The process separates rapid deposition (sputtering) from quality enhancement (heat treatment), allowing each function to be optimized independently without compromise

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Temperature is changed between two distinct values: first temperature during sputtering for rapid deposition, then second temperature during heat treatment for quality improvement. This parameter change enables the system to achieve both speed and quality

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If heat treatment temperature is increased to improve film crystallinity, then material quality improves, but energy consumption increases

Engineering Contradiction:
ImprovecrystallinityVSAvoidheat treatment energy
Core Design Contradiction:
Manufacturing precisionVSUse of energy by stationary object

Solution Approach 1:

The sputtering process performs preliminary film formation, creating a structure that requires less energy for crystallization during heat treatment. This preliminary structuring reduces the total energy needed compared to forming crystalline structure from scratch

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The process uses two distinct temperature parameters: lower temperature during sputtering and higher temperature during heat treatment. This optimized temperature sequence achieves crystallinity while minimizing total energy consumption

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the rapid formation of high-quality, uniform transition metal dichalcogenide thin films over large areas, suitable for electronic devices, with the ability to adjust thickness and ensure uniformity, overcoming scalability and time constraints of conventional methods.

Implementation Method 1

depositing a transition metal dichalcogenide thin film on the substrate using a sputtering process that uses a precursor

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 2

heat-treating the transition metal dichalcogenide thin film on the substrate at a second temperature under a chalcogen atmosphere

Methodology Applied
Scientific EffectHeat treatment: Heat Treatment

Implementation Method 3

The transition metal dichalcogenide thin film may include at least one of an amorphous material and a polycrystalline material

Methodology Applied
Scientific EffectCrystallisation: Crystallisation

Data Source

PatentUS11887849B2Method of forming transition metal dichalcogenidethin film and method of manufacturing electronic device including the same
Publication Date: 2024.01.30 SAMSUNG ELECTRONICS CO LTD
  • US11887849B2 patent drawing
  • US11887849B2 patent drawing
  • US11887849B2 patent drawing

AI summary

Disclosed herein are a method of forming a transition metal dichalcogenide thin film and a method of manufacturing a device including the same. The method of forming a transition metal dichalcogenide thin film includes: depositing a transition metal dichalcogenide thin film on a substrate; and heat-treating the deposited transition metal dichalcogenide thin film.