Total Station Scanning with Adaptive SPAD Receiver
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Solution Overview
Problem
Existing total stations and theodolites face limitations in scanning speed and accuracy due to the need for sluggish components to move for two-dimensional alignment, which restricts measurement range and introduces noise from background light, especially at greater distances.
Innovation Solution
The implementation of a total station or theodolite with a settable beam deflection element and an optoelectronic sensor using SPAD arrays, allowing for precise control of the active acquisition region and adaptive optimization of the receiver surface to minimize background light interference, enabling rapid and accurate distance measurements over extended ranges.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the entire detector surface is used for acquisition, then the acquisition area is maximized, but background light noise increases significantly
Solution Approach 1:
The patent applies local quality by making different regions of the detector surface serve different functions. The active acquisition region is dynamically adjusted to match the beam position, ensuring that only the necessary local area is active while other regions remain inactive to minimize background light noise. This is achieved through the control unit that sets the active acquisition region based on beam position feedback.
2Measurement precision
If sluggish components are moved for two-dimensional alignment, then the alignment accuracy is achieved, but the scanning speed is restricted
Solution Approach 1:
The patent replaces the mechanical alignment system with an optical/electronic solution. Instead of moving sluggish mechanical components for two-dimensional alignment, the system uses a rapidly deflectable beam and dynamically adjusts the active acquisition region on the detector surface through electronic control. This substitution of mechanical movement with electronic beam deflection and region adjustment maintains alignment accuracy while dramatically increasing scanning speed.
3Measurement precision
If the active acquisition region is dynamically adjusted to minimize background light, then the signal-to-noise ratio is improved, but the device complexity increases
Solution Approach 1:
The control unit serves multiple functions: it manages the active acquisition region settings, tracks beam position, coordinates with the rapid deflection device, and optimizes the signal-to-noise ratio. By consolidating these functions into a single multi-functional control unit, the patent reduces overall system complexity while maintaining the ability to dynamically adjust the active acquisition region for optimal performance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances scanning speed and accuracy by reducing noise and background light interference, allowing for dense point cloud generation over larger spatial angles with improved signal-to-noise ratio and measurement precision.
Implementation Method 1
an optoelectronic sensor, in particular having a SPAD assembly or a SiPM assembly, as a photosensitive surface
Implementation Method 2
a settable beam deflection element, which is configured to deflect the distance measuring beam such that the targeting axis is variable in a defined manner in relation to the carrier
Implementation Method 3
a radiation source for generating a transmitted radiation
Data Source
AI summary
A total station or a theodolite includes scanning functionality for optical surveying of an environment, in which the total station or the theodolite is configured such that direction-dependent active acquisition regions of the receiver are defined depending on the transmission direction of the transmitted radiation to adapt the receiver surface mechanically and/or electronically to a varying imaging position of the received radiation on the overall detector surface.


