In-Cell Touch Panel Common Electrode Laser Test Connection
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Solution Overview
Problem
Conventional in-cell touch panels face difficulties in testing the potential of common electrodes due to their arrangement beneath insulation layers, making it challenging to use probes without risking short-circuits and affecting test accuracy.
Innovation Solution
An array substrate with a common electrode structure and a conductive structure for testing, where laser melting is used to electrically connect the common electrode to the conductive structure, allowing for precise probing without contacting other components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the common electrode is arranged below the insulation layer to reduce touch screen size, then the in-cell TP size is reduced, but the difficulty of testing the common electrode potential increases and test accuracy deteriorates
Solution Approach 1:
The patent introduces a test electrode as an intermediary element that can be electrically connected to the common electrode through laser drilling of the insulation layer. This mediator allows external testing equipment to measure the common electrode potential without directly penetrating the insulation layer during normal operation, thus resolving the contradiction between compact structure and testability.
Solution Approach 2:
The patent pre-arranges a test electrode and establishes a potential connection path through the insulation layer before final assembly. This preliminary preparation enables future testing without requiring invasive procedures during actual measurement, addressing the testing difficulty while maintaining the compact in-cell structure.
2Measurement precision
If a probe is used to pierce the insulation layer to test the common electrode, then the potential can be measured, but the risk of short-circuiting the pixel electrode to the common electrode increases
Solution Approach 1:
The test electrode serves as a safe intermediary that provides a controlled measurement path. Instead of directly piercing the insulation layer with a probe during testing, the measurement is routed through the pre-positioned test electrode, eliminating the risk of accidental short-circuits while maintaining measurement capability.
Solution Approach 2:
The patent prepares a dedicated test electrode and connection path in advance, creating a cushioning protective structure that prevents direct contact between the testing probe and sensitive electrodes. This preliminary protection mechanism ensures reliable testing without the risk of short-circuiting during the measurement process.
3Reliability
If the common electrode structure is insulated from the conductive structure for testing during normal operation, then the potential of the common electrode is not susceptible to interference, but the complexity of the device structure increases
Solution Approach 1:
The patent segments the electrode system into functionally independent parts: the common electrode structure for display operation and the test electrode for measurement. This segmentation allows the common electrode to maintain its insulation and potential stability during normal operation, while the separate test electrode provides testing capability without interfering with the display function.
Solution Approach 2:
The patent creates a dynamic configuration where the electrical connection between the common electrode and test electrode can be selectively activated. During normal operation, the insulation maintains potential stability; during testing, the connection is established through laser drilling. This dynamic adaptability resolves the contradiction between reliability and complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method reduces the difficulty of testing common electrode potentials and improves test accuracy by ensuring the common electrode is insulated from the conductive structure during normal operation, preventing interference and short-circuits.
Implementation Method 1
Laser melting may be performed on the overlapping area to electrically connect the common electrode structure to the conductive structure for testing
Data Source
AI summary
An array substrate, a touch display apparatus and a test method thereof are provided. The array substrate can include a substrate, a common electrode structure and a conductive structure for testing. The common electrode structure and conductive structure can be arranged on a same side of the substrate. The common electrode structure can be insulated from the conductive structure for testing. There can be an overlapping area between a projection of the common electrode structure and a projection of the conductive structure for testing in a direction perpendicular to the substrate. Laser melting may be performed on the overlapping area to electrically connect the common electrode structure to the conductive structure for testing.