Pre-Assembly Defect Detection for Touch Panel Electrode Sheets
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Solution Overview
Problem
Existing methods for identifying defects in touch panel electrode sheets are limited as they require assembly and bonding before defects can be detected, making it impossible to reuse defective sheets and requiring additional user effort to locate the defect.
Innovation Solution
An electronic apparatus and method that uses an external device to apply signals to electrode sheets before assembly, allowing for the identification of defects and their location in the electrode sheets based on signal analysis, enabling pre-assembly defect detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If defect identification is performed after assembling and bonding electrode sheets, then the touch panel can be tested for faults, but the electrode sheet cannot be reused and additional user work is required to locate the defect
Solution Approach 1:
The patent applies preliminary action by performing defect identification on electrode sheets before they are assembled and bonded into a touch panel. The testing device connects to the electrode sheet through a connection unit prior to bonding, allowing defects to be detected and their locations identified in advance. This prevents the loss of time that would otherwise be required to locate defects after assembly, and enables reuse of confirmed good electrode sheets.
2Reliability
If defect identification is performed after assembling and bonding electrode sheets, then the touch panel can be tested for faults, but it is impossible to reuse the electrode sheet identified to be defective
Solution Approach 1:
The patent performs defect identification before the electrode sheet is bonded into the final product. By testing the electrode sheet while it is still separate and accessible through the connection unit, the system can identify defects early. This allows confirmed defect-free electrode sheets to be reused in production, reducing material waste while maintaining product reliability.
3Reliability
If existing defect identification methods are used, then defects can be detected after assembly, but additional work by user is required because defect location is unknown
Solution Approach 1:
The patent performs defect location identification as part of the preliminary testing process before assembly. The testing device not only detects whether defects exist but also determines their specific locations on the electrode sheet while it is still accessible. This eliminates the need for additional user work after assembly to locate defects, making the process easier to operate while maintaining reliable defect detection.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the identification and location of defects in electrode sheets before assembly, allowing for the potential reuse of sheets and reducing user effort by facilitating early defect detection.
Implementation Method 1
a first point at which a first signal is applied to the transparent electrode sheet, a second point at which a second signal which is a response signal to the first signal is acquired
Data Source
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AI summary
An electronic apparatus is provided. The electronic apparatus includes a communication interface configured to communicate with an external device, a memory, and a processor. The processor is configured to transmit a control signal requesting the external device to apply a first signal to a transparent electrode sheet connected to the external device, to the external device, receive, from the external device, a first point at which the first signal is applied to the transparent electrode sheet, a second point at which a second signal that is a response signal to the first signal is acquired by the external device, and a waveform of the second signal, and identify whether a defect exists in the transparent electrode sheet based on a difference between the first point and the second point, and the waveform of the second signal.