Touch Sensing Unit Aging Method for Foreign Matter Short Prevention
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Solution Overview
Problem
Display devices with touch sensing units often experience malfunctions due to shorts caused by foreign matter between touch electrodes and wirings during manufacturing, which existing aging methods fail to adequately prevent.
Innovation Solution
A touch sensing unit design incorporating a base layer with a touch sensing area and peripheral area, including touch electrodes, lines, inspection pads, and thin film transistors, where inspection transistors are selectively connected to odd-numbered touch lines and pads, and an aging method applying gate-off and gate-on voltages to create potential differences between touch lines to prevent shorts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a touch sensing unit is manufactured with touch electrodes and wirings, then the touch sensing function is achieved, but shorts between electrodes and wirings may occur due to foreign matter during manufacturing
Solution Approach 1:
The patent applies an aging method before the touch sensing unit is fully assembled and before normal operation begins. A predetermined voltage is applied to the touch electrodes and wirings to create electrical stress that removes foreign matter and prevents shorts. This preliminary action eliminates potential defects before they can cause malfunctions during actual use.
Solution Approach 2:
The aging process creates a controlled electrical stress environment that counteracts the potential harmful effect of foreign matter. By applying voltage before foreign matter can cause shorts, the method creates a protective effect that prevents the harmful interaction between foreign matter and electrical components.
2Reliability
If an aging method is applied to prevent shorts, then reliability is improved, but additional manufacturing steps and time are required
Solution Approach 1:
The aging process is integrated into the existing manufacturing flow by combining it with the inspection process. The same test equipment and procedures used for inspecting touch electrode connections are also used to apply the aging voltage. This merging of functions eliminates the need for separate aging equipment and reduces additional manufacturing steps.
3Difficulty of detecting and measuring
If inspection pads and thin film transistors are added to the touch sensing unit, then defect detection capability is improved, but device complexity increases
Solution Approach 1:
Inspection pads are introduced as intermediary elements that facilitate the detection of defects without requiring direct access to the touch electrodes. These pads serve as intermediate connection points that allow test signals to be applied and measured, making defect detection easier while adding minimal structural complexity.
Solution Approach 2:
The touch sensing unit is segmented into functional regions including touch electrodes, wirings, and inspection pads. This segmentation allows the inspection pads to be positioned in specific areas (such as peripheral regions) where they can access multiple touch electrodes through the wiring network, thereby improving detection capability without proportionally increasing overall device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively prevents both electrode and wiring shorts, enhancing the reliability and durability of touch sensing units in display devices by ensuring proper electrical connections and reducing the risk of foreign matter-induced malfunctions.
Implementation Method 1
an aging method may be used where a predetermined voltage is applied to the touch sensing unit
Data Source
AI summary
A touch sensing unit includes a base layer including a touch sensing area and a touch peripheral area, a touch electrode disposed in the touch sensing area, a touch line disposed in the touch peripheral area and electrically connected to the touch electrode, an inspection pad disposed in a pad area located at one side of the touch peripheral area, and an inspection thin film transistor disposed in the pad area and electrically connected to the touch line and the inspection pad.