Touch Sensor Inspection Noise Removal
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing touch panel inspection methods struggle to accurately determine the operability of touch-sensing devices due to noise interference from varying inspection systems, leading to potential misclassification of normal or defective products.
Innovation Solution
An inspection device and method that utilize a data processor to remove noise from raw data by using intrinsic coefficients specific to each type of touch IC, calculated through average noise change rates and stored in a lookup table, to obtain consistent touch sensor data, ensuring accurate determination of touch-sensing device operability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If raw data is directly used to determine touch-sensing device operability, then inspection process is simple, but measurement precision deteriorates due to noise interference from varying inspection systems
Solution Approach 1:
The patent introduces an intermediary data processing system that includes a data receiver and data processor. This intermediary system receives raw data from the touch IC, removes noise using inspection system-specific characteristics, and outputs cleaned touch sensor data. This mediator resolves the contradiction by adding a processing layer between data collection and analysis, improving measurement precision without significantly increasing overall inspection complexity.
Solution Approach 2:
The patent changes the parameter representation by transforming raw data into cleaned touch sensor data through noise removal operations. The data processor modifies the data parameters using inspection system-specific characteristics (such as noise profiles or calibration factors) to convert inaccurate raw measurements into accurate touch sensor readings, thereby improving measurement precision while maintaining process simplicity.
2Measurement precision
If noise removal processing is applied to raw data, then measurement precision improves, but device complexity increases due to additional processing steps
Solution Approach 1:
The patent segments the data processing function into distinct modular components: a data receiver that collects raw data from the touch IC, and a data processor that performs noise removal. This segmentation allows the noise removal functionality to be implemented as a separate, manageable module with specific processing steps (receiving raw data, removing noise using inspection system characteristics, outputting cleaned data), thereby improving measurement precision while keeping the added complexity organized and controllable.
Solution Approach 2:
The data processing system performs self-calibration by using inspection system-specific characteristics that are determined during system setup or calibration. The system automatically adjusts noise removal parameters based on the specific inspection system being used, without requiring external intervention or complex manual configuration. This self-service approach improves measurement precision while minimizing the operational complexity burden on users.
3Measurement precision
If inspection system-specific characteristics are used for noise removal, then measurement precision improves, but adaptability deteriorates due to system-specific calibration requirements
Solution Approach 1:
The patent applies local quality by tailoring the noise removal process to the specific characteristics of each inspection system. Instead of using a universal noise removal method, the system uses inspection system-specific characteristics (such as system-unique noise profiles or calibration factors) to optimize noise removal for each particular inspection system. This improves measurement precision for each system while accepting that the system is optimized for its specific context rather than being universally applicable.
Solution Approach 2:
The patent performs preliminary calibration and characterisation of inspection system-specific characteristics during system setup or before actual inspection. The system pre-determines noise profiles, calibration factors, or other system-specific parameters and stores them for use during inspection. This preliminary action allows the system to achieve high measurement precision for each specific inspection system without requiring complex real-time adaptation, thereby managing the adaptability trade-off by preparing system-specific parameters in advance.
Data Source
AI summary
Provided is an inspection device for inspecting a touch-sensing device including a plurality of touch sensors, the inspection device including a data receiver configured to receive raw data from a touch integrated circuit (IC) that is configured to supply a signal for inspection to the touch-sensing device, and that is configured to measure a value output from the touch-sensing device, and a data processor configured to determine operability of the touch-sensing device by using the raw data, and configured to remove noise from the raw data by using first data measured when the touch-sensing device is not electrically connected to the touch IC.