Touch Structure Test Points for Open Circuit Detection
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Solution Overview
Problem
Conventional touch panels face challenges in performing open circuit tests on touch electrodes and leads, especially when an insulating layer is present, as probes cannot be electrically connected, affecting the reliability of the test in certain connection structures.
Innovation Solution
A touch structure is designed with additional third and fourth leads that serve as test points, allowing probes to be placed at wiring terminals and test points without direct connection to the electrodes, enabling open circuit testing even with insulating layers, by providing a separate path for testing resistance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an insulating layer is laid on the touch electrode to protect or insulate it, then the reliability and safety of the touch panel are improved, but the ability to perform open circuit tests on the touch electrode and leads is worsened because probes cannot be electrically connected to the touch electrode
Solution Approach 1:
The patent introduces test leads as intermediary elements that connect to the touch electrode through the insulating layer. These test leads serve as mediators between the probing system and the touch electrode, enabling electrical connection for testing without compromising the insulating protection. The test leads are specifically designed to penetrate or contact the insulating layer at designated test points, allowing probe connection while maintaining insulation elsewhere.
Solution Approach 2:
The patent segments the touch electrode structure by providing dedicated test regions or test points that are distinct from the functional touch sensing areas. The insulating layer is also segmented, with specific regions removed or made conductive to allow probe access. This segmentation enables simultaneous presence of insulating protection and test accessibility.
2Measurement precision
If probes are placed directly on the touch electrode for testing, then the measurement accuracy is improved, but the operational flexibility is worsened because testing cannot be performed when insulating layers are present
Solution Approach 1:
The patent creates a universal testing interface by introducing standardized test leads and test points that work across different touch electrode connection structures (first type, second type, and third type connection manners). The test leads are designed to be compatible with various connection configurations, enabling the same testing methodology to be applied universally regardless of the specific connection structure or presence of insulating layers.
3Device complexity
If the touch electrode and leads are tested without additional test leads, then the device complexity is reduced, but the ease of operation is worsened because testing requires direct probe placement on electrodes which is not always feasible
Solution Approach 1:
The patent applies preliminary action by incorporating test leads during the manufacturing process, before the final assembly and testing stages. The test leads are pre-connected to the touch electrodes and leads, and the insulating layers are applied with predetermined test point openings. This preliminary setup eliminates the need for complex probe placement operations during final testing, as the test interface is already prepared and accessible.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for reliable open circuit testing on touch panels with insulating layers, improving the yield rate and operational reliability by ensuring accurate detection of open circuits in various connection configurations.
Implementation Method 1
a resistance between the two probes is tested to determine whether there is an open circuit on the touch electrode and the leads
Data Source
AI summary
The present disclosure provides a touch structure, a test method thereof, a touch panel and a display apparatus. In the touch structure, by taking touch driving electrodes as an example, a plurality of third leads which are insulated from each other and are in one-to-one correspondence with various touch driving electrodes are additionally provided, wherein each of the third leads has one terminal electrically connected to a corresponding touch driving electrode and the other terminal serving as a test point for testing whether there is an open circuit on the corresponding touch driving electrode and the corresponding first lead. In this way, two probes may be placed at a test point in a third lead and a first wiring terminal in a binding area respectively when an open circuit test is conducted on each of the touch driving electrodes and a corresponding first lead.