Touch Sensor Trace Inspection Lines for Scratch Defect Detection
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Solution Overview
Problem
Existing display apparatuses, particularly organic light-emitting display apparatuses, face challenges in efficiently detecting fine scratches or short-circuit defects in trace lines due to minimal resistance changes, which can lead to malfunctions under high temperature and humidity conditions.
Innovation Solution
Incorporation of inspection lines made of conductive oxide that overlap and are connected to trace lines, allowing for easy detection of defects by measuring resistance changes through terminal parts, ensuring accurate identification of scratches or short-circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If trace lines are used in the touch sensor layer, then electrical connection between electrodes is achieved, but fine scratches or short-circuit defects are difficult to detect due to minimal resistance changes
Solution Approach 1:
The patent creates a copy of the trace line structure by forming an inspection line that overlaps with the trace line. This inspection line serves as a duplicate sensing element that can be independently monitored for defects. When a scratch or short-circuit occurs in the trace line, the overlapping inspection line experiences corresponding resistance changes that are easier to detect, thereby solving the detection difficulty without affecting the original trace line's electrical connection function
Solution Approach 2:
The inspection line acts as an intermediary element between the trace line and the defect detection system. Instead of directly monitoring the trace line's resistance (which shows minimal changes), the inspection line provides an intermediate measurement path that amplifies or makes visible the defects. The inspection line translates subtle trace line defects into measurable resistance changes that can be easily detected by testing equipment
2Difficulty of detecting and measuring
If inspection lines are added to detect defects, then defect detection capability is improved, but device structure becomes more complex
Solution Approach 1:
The patent merges the inspection line formation with existing manufacturing processes by using the same pixel-defining mask that is already employed for forming trace lines. The inspection line is formed simultaneously with other structure elements during the same deposition and patterning steps, eliminating the need for separate inspection line fabrication processes. This integration approach adds minimal structural complexity while achieving improved defect detection capability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The implementation of inspection lines enables effective detection of fine scratches and short-circuit defects in trace lines, preventing corrosion and ensuring reliable operation of the display apparatus under varying environmental conditions.
Implementation Method 1
measuring resistance changes through terminal parts
Data Source
AI summary
A display apparatus includes a substrate that includes a display area and a peripheral area outside the display area, a sealing substrate disposed on the substrate, a touch sensor layer disposed on the sealing substrate, a trace line disposed on the sealing substrate in the peripheral area, and an inspection line disposed on the trace line and that overlaps the trace line. The inspection line includes a different material from the trace line.