Trace-Based SDI Testing for Internal Signal Observability
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Solution Overview
Problem
Existing testing methodologies for high-speed bus interfaces in electronic devices face challenges in accessing internal signals, making it difficult to ensure functionality, longevity, and quality, especially when designs are committed to hardware.
Innovation Solution
A trace-based testing approach is employed using a software device-under-test interface (SDI) with software access points and a test instruction set architecture (TISA) to observe and modify internal signals, allowing for detailed analysis and debugging of device-under-test (DUT) behavior.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If hardware-based testing is used for device-under-test, then testing can be performed on physical devices, but access to internal signals is restricted making debugging difficult
Solution Approach 1:
A software device-under-test interface (SDI) is introduced as an intermediary layer between the test environment and the hardware device-under-test. The SDI provides software access points that allow observers to monitor and debug internal signals and states without directly accessing the hardware, thus resolving the contradiction between reliable hardware testing and difficulty of internal signal detection.
2Measurement precision
If trace encoding is implemented to capture internal states, then detailed debugging information is obtained, but system complexity increases
Solution Approach 1:
Instead of directly accessing and modifying complex hardware internal states, the system creates software copies of these states through the SDI. The trace encoder captures and stores these software representations, allowing detailed analysis without adding physical hardware complexity. This copying approach enables precise measurement while keeping the actual device structure simple.
Data Source
AI summary
Testing techniques are disclosed. A test environment is accessed. The test environment includes a trace encoder and a software device-under-test interface (SDI). The SDI is coupled to a device-under-test (DUT). Software access points are inserted into the SDI to allow observability of one or more internal signals within the SDI. Modification instructions that cause the SDI to autonomously alter a response to the DUT are programmed into the SDI. The modification instructions are based on a test instruction set architecture. A test sequence is sent to the SDI, causing communications with the device under test. Replies are received from the DUT. The SDI responds to the replies and sends additional communications to the device under test. Additional replies are obtained from the DUT. A trace encoder creates a logic trace comprised of the states of the software access points.