Trace Control Register for Post-Silicon Signal Visibility
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Solution Overview
Problem
Post-silicon testing of integrated circuits lacks visibility into their inner workings and computational power to analyze field use cases, making it difficult to assess logical testing coverage effectively.
Innovation Solution
The implementation of a trace control register system that captures and outputs signals from combinatorial logic blocks, providing increased visibility and allowing for the capture of events within the logic blocks, thereby enhancing post-silicon validation and debugging capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If post-silicon testing is performed on integrated circuits, then operational testing coverage is increased, but visibility into inner workings and ability to assess test coverage is lost
Solution Approach 1:
The patent introduces an intermediary system consisting of observation circuits, trace control registers, and output paths that mediate between the integrated circuit's internal operations and external testing equipment. These observation circuits tap into internal signals without disrupting normal operation, while trace control registers capture and store signal states for later analysis, providing the needed visibility into inner workings during post-silicon testing.
Solution Approach 2:
The patent creates copies of internal circuit signals by capturing signal states in trace control registers. Instead of directly observing internal workings in real-time, the system creates replicated versions of signal states that can be externally accessed and analyzed. This copying mechanism preserves the original circuit operation while providing external visibility through captured signal representations.
2Ease of operation
If traditional functional testing is used, then test implementation is straightforward, but ability to assess logical coverage in post-silicon phase is severely limited
Solution Approach 1:
The patent implements a self-service mechanism where the integrated circuit itself generates the data needed for coverage assessment. Observation circuits within the circuit automatically capture internal signal states, and trace control registers automatically store these states without requiring external intervention. This self-service approach maintains ease of operation while dramatically improving measurement precision of logical coverage.
Solution Approach 2:
The patent establishes a feedback loop where captured signal states from internal operations are fed back to external testing equipment through output paths. This feedback mechanism provides the external tester with information about actual circuit behavior, enabling precise assessment of logical coverage while maintaining simple test implementation through automated data collection.
Data Source
AI summary
According to one general aspect, an apparatus may include a trace control register, a first output path, and a second output path. The trace control register may be configured to receive one or more signals output by a combinatorial logic block. The trace control register may include a first register portion configured to capture the one or more signals. The trace control register may include a second register portion configured to capture whether an event occurred within the combinatorial logic block. The occurrence of the event is determined by at least a portion of the one or more signals having a predetermined state. The first output path configured to select between a plurality of captured signals provided by respective trace control registers. The second output path configured to output one or more captured events provided by one or more respective trace control registers.