Trace Network for Integrated Circuit Debug Isolation

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Solution Overview

Problem

Traditional debug mechanisms for integrated circuits disrupt traffic on the SoC or IC during debugging, making it difficult to perform effective debug operations.

Innovation Solution

A separate trace network is implemented in parallel with other networks on the IC/SoC, comprising trace circuits and switches that generate and convey trace data to a trace controller without using the functional networks, thereby isolating debug traffic from operational traffic.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If traditional debug mechanisms are used to access internal circuit points, then visibility into internal operation is improved, but traffic disruption on the IC occurs

Engineering Contradiction:

Improvevisibility into internal operationVSAvoidtraffic disruption

Core Design Contradiction:

Loss of informationVSObject-affected harmful factors

Solution Approach 1:

The patent divides the IC into two separate networks: a functional network for normal operation and a trace network for debugging. This segmentation allows debug operations to occur independently without interfering with functional traffic, resolving the contradiction between gaining visibility and avoiding disruption.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent introduces a trace network as an intermediary system that captures and transports trace data from functional components through dedicated trace switches and buffers to external debug interfaces. This intermediary structure enables observation without direct interference with the functional network's traffic flow.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Object-affected harmful factors

If a separate trace network is implemented, then traffic isolation is improved, but device complexity increases

Engineering Contradiction:

Improvetraffic disruptionVSAvoidnetwork structure

Core Design Contradiction:

Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The trace network components (trace circuits, trace switches, trace buffers) are designed to work together as an integrated debugging system that can observe multiple functional networks simultaneously. This multi-functionality justifies the added complexity by providing comprehensive debugging capability across the entire IC.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Solution Approach 2:

The trace network operates autonomously, capturing trace data from functional components and managing its own data transport and buffering without requiring intervention in the functional networks. This self-service capability reduces the operational burden despite the increased structural complexity.

Inventive Principle:

Principle #25Self-service

Data Source

PatentUS20250077384A1Debug Trace Fabric for Integrated Circuit

Publication Date: 2025.03.06 APPLE INC

AI summary

A trace network for debugging integrated circuits is disclosed. At least one functional network includes a plurality of components interconnected by a number of network switches, implemented on at least one integrated circuit. A trace network is also implemented on the at least one integrated circuit, and includes a plurality of trace circuits configured to generate trace data based on transactions between ones of the plurality of components. The plurality of trace circuits are coupled to one another by a plurality of trace network switches. The trace circuits are configured to convey the generated trace data to an interface, via the trace network, without using the at least one functional network.