Tracked Beam Steering for Optical Inspection of Material Streams
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing optical examination methods for objects in a material stream suffer from insufficient spectral resolution, low flexibility, mechanical failures, high data stream generation, unfavorable signal-to-noise ratio, and the need for high-speed illumination switching, which limits light sources and measurement speed.
Innovation Solution
A device comprising a light source, tracking device, and deflection device that uses point light sources, tracking, and beam deflection to selectively illuminate and detect specific areas of moving objects, allowing flexible measurement times and improved signal-to-noise ratio, using multispectral or hyperspectral examination light with adjustable wavelengths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If classical line spectroscopy with dispersive optical elements is used, then spectral resolution is improved, but manufacturing precision requirements and device complexity increase
Solution Approach 1:
The patent divides the illumination task into multiple point light sources, each illuminating a specific measuring area. This segmentation allows independent optimization of each light source's spectral characteristics without requiring the entire system to meet high manufacturing precision standards for dispersive elements.
Solution Approach 2:
The patent replaces mechanical dispersive optical elements with a combination of point light sources and tracking/deflection devices. This substitution eliminates the need for high-precision mechanical alignment and manufacturing of dispersive components while achieving comparable or superior spectral resolution through selective illumination.
2Measurement precision
If multispectral cameras with camera arrays are used, then spectral information is improved, but data stream volume and device complexity increase
Solution Approach 1:
The patent extracts only the necessary spectral information by using point light sources that illuminate specific measuring areas. Instead of capturing data from the entire material stream area, the system extracts information only from the tracked objects, significantly reducing data volume while maintaining spectral information quality.
Solution Approach 2:
The patent applies local quality by directing examination light onto specific measuring areas of tracked objects rather than illuminating the entire field of view. This localized approach ensures high spectral information quality for relevant areas while minimizing unnecessary data generation from background areas.
3Adaptability or versatility
If time-varying illumination with different predefined light spectra is used, then spectral flexibility is improved, but measurement speed and illumination lifespan decrease
Solution Approach 1:
The patent uses multiple point light sources with different spectral distributions that are pre-configured and ready simultaneously. Instead of switching between light sources in sequence, all required spectral types are available at once, eliminating switching time and maintaining high measurement speed while providing full spectral flexibility.
Solution Approach 2:
The patent dynamically selects which point light source illuminates which measuring area based on tracking information. This dynamic assignment allows the system to provide different spectra at different locations and times without mechanical switching, maintaining both spectral flexibility and measurement speed.
4Area of stationary object
If illumination of a relatively large area is used, then coverage is improved, but signal-to-noise ratio deteriorates
Solution Approach 1:
The patent applies local quality by illuminating only the specific measuring areas of tracked objects with point light sources. This concentrated illumination increases the signal intensity from the objects of interest while reducing background noise from surrounding areas, significantly improving the signal-to-noise ratio while maintaining adequate coverage through tracking.
Solution Approach 2:
The patent segments the illumination into multiple point light sources, each targeting a specific measuring area. This segmentation allows the system to provide comprehensive coverage of multiple objects without diluting the illumination intensity, as each point source concentrates its energy on its designated target rather than spreading it across a large area.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise, flexible, and efficient optical examination of objects in a material stream with reduced data generation and improved signal quality, enabling methods like Raman spectroscopy and laser-induced plasma spectroscopy without area-wide coverage.
Implementation Method 1
a portion of the examination light reflected from the tracked object
Implementation Method 2
a sensor device with an optical sensor... direct a portion of the examination light reflected from the tracked object onto the sensor device with the optical sensor
Data Source
Figure 1
AI summary
The invention relates to a device (1) for optically inspecting objects (2) in a material stream, especially for optical spectroscopy of objects (2) in a material stream, comprising a light source apparatus (3) for producing an inspection light (8, 8*) suitable for optically inspecting the objects (2) in the material stream; a tracking apparatus (4) for tracking at least one object (2) in the material stream and outputting spatial information relating to the tracked object (2); a deflection apparatus (5) for steering the inspection light (8, 8*) to the tracked object (2) or steering a component (8', 8'*) of the inspection light (8, 8*) that was reflected by the tracked object (2) to a sensor apparatus (6) having an optical sensor, the steering being carried out in accordance with the output spatial information, in order to improve the optical inspection of objects (2) in a material stream.