Optical Transceiver Defect Prediction via Bias Trends

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Solution Overview

Problem

Optical transceiver devices in communication systems, such as those used in MRI systems, are prone to dark line defects due to electrostatic discharge, leading to exponential increase in transmit bias and eventual failure, which can cause hard system failures, making it difficult to detect defects before they result in complete device failure.

Innovation Solution

A method that predicts degradation of optical transceiver devices by calculating features from parametric data like transmit bias and temperature, using a learning model to identify characteristic signatures indicative of dark line defects, and generating notifications for proactive replacement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If optical transceiver devices are used in communication systems, then data transmission capability is improved, but susceptibility to dark line defects and device failure increases

Engineering Contradiction:
Improvedata transmission capabilityVSAvoiddevice failure resistance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system performs preliminary monitoring of transmit bias values over time and uses a learning model to predict dark line defects before they cause device failure. This allows proactive replacement of transceiver devices before they fail, maintaining high reliability while preserving data transmission capability.

Inventive Principle:
Principle #10Preliminary action

2Difficulty of detecting and measuring

If traditional defect detection methods are used, then device failure can be detected, but detection before complete failure is difficult

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidtime to detect defect
Core Design Contradiction:
Difficulty of detecting and measuringVSLoss of time

Solution Approach 1:

The system continuously monitors transmit bias values and feeds this data back to a learning model that analyzes trends over time. This feedback mechanism enables early detection of dark line defects by identifying characteristic patterns in the transmit bias data before they progress to complete device failure, reducing detection time and preventing system downtime.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10396897B1Systems and methods for predicting defects in optical transceiver devices
Publication Date: 2019.08.27 GE PRECISION HEALTHCARE LLC
  • US10396897B1 patent drawing
  • US10396897B1 patent drawing
  • US10396897B1 patent drawing

AI summary

Methods and systems are provided for monitoring optical transceiver devices. In one embodiment, a method comprises predicting degradation of an optical transceiver device based on values of an operating parameter of the optical transceiver device obtained over time, and generating a notification of the degradation of the optical transceiver device. In this way, an optical transceiver device that is susceptible to degradation may be pre-emptively identified and replaced, thereby preventing failures of a communication system including the optical transceiver device.