Optical Transceiver Extinction Ratio Testing Under Temperature Drift

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Solution Overview

Problem

The existing extinction ratio test for optical transceiver modules has a low pass rate, particularly due to temperature variations, which affects production capacity.

Innovation Solution

An extinction ratio testing system comprising a microcontroller, an extinction ratio tester, and a thermostat that controls the optical transceiver module's temperature and laser operating current to ensure the extinction ratio meets standards, including a counter to track current adjustments and determine module qualification or failure based on repeated adjustments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the optical transceiver module is tested at different temperatures separately, then the testing accuracy is improved, but the production capacity deteriorates

Engineering Contradiction:
Improvetesting accuracyVSAvoidproduction capacity
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent combines multiple temperature testing procedures into a single integrated testing process. The system performs normal temperature extinction ratio testing, high temperature extinction ratio testing, and high temperature high current extinction ratio testing in sequence without removing the module from the testing system, thereby maintaining testing accuracy while improving production capacity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system performs preliminary testing at normal temperature before high temperature testing. This preliminary action identifies modules that pass early, allowing the system to proceed efficiently through subsequent testing stages without unnecessary delays.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If multiple testing procedures are performed sequentially, then the testing thoroughness is improved, but the testing time deteriorates

Engineering Contradiction:
Improvetesting thoroughnessVSAvoidtesting time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The testing process is segmented into distinct but integrated procedures: normal temperature extinction ratio testing, high temperature extinction ratio testing, and high temperature high current extinction ratio testing. Each segment focuses on specific performance aspects and can be executed in sequence without breaking the overall testing flow, reducing total testing time while maintaining thoroughness.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system maintains continuous testing action throughout the process. The module remains in the testing system throughout all procedures, and the system continuously monitors performance parameters. This continuous action eliminates idle time between testing stages and ensures that useful testing activity occurs throughout the entire process.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improves the pass rate of extinction ratio tests by effectively testing optical transceiver modules at various temperatures and adjusting laser current to meet performance standards, thereby enhancing production efficiency.

Implementation Method 1

the microcontroller is configured to control the thermostat to maintain the optical transceiver module at a predetermined high temperature

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

a laser diode 204, an optical fiber 206

Methodology Applied
Scientific EffectLight emission from laser diode: Laser

Data Source

PatentUS11742945B2Extinction ratio testing system for optical transceiver module and extinction ratio testing method for optical transceiver module
Publication Date: 2023.08.29 JESS-LINK PRODUCTS
  • US11742945B2 patent drawing
  • US11742945B2 patent drawing

AI summary

An extinction ratio testing system (10) includes a microcontroller (102), an extinction ratio tester (104), and a thermostat (106). The microcontroller (102) controls the thermostat (106) to maintain an optical transceiver module (20) at a predetermined high temperature, and then the microcontroller (102) controls the extinction ratio tester (104) to test an extinction ratio of the optical transceiver module (20). If the extinction ratio is lower than a standard extinction ratio, the microcontroller (102) controls the optical transceiver module (20) to increase a laser operating current (212) of the optical transceiver module (20) to increase the extinction ratio.