Transceiver Jitter Measurement Using Dual-Clock Self-Sampling
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Solution Overview
Problem
Conventional methods for measuring jitter in integrated circuits, such as programmable logic devices and transceivers, are time-consuming and require costly external equipment, making it impractical for real-time testing during production.
Innovation Solution
A system that generates two clock signals with slightly different frequencies, one for the transmitter and one for the receiver, allowing for rapid measurement of jitter by sampling the output signal at different times within a clock cycle, using a phase locked loop and logic circuits to determine timing characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional jitter measurement methods are used, then measurement accuracy is achieved, but measurement time becomes excessively long (20-30 seconds per channel)
Solution Approach 1:
The patent applies preliminary action by pre-configuring multiple clock signals with slightly different frequencies within the transceiver before measurement. This allows the measurement system to capture timing variations across multiple phases in advance, enabling rapid jitter calculation without requiring lengthy external measurement sequences. The internal clock signals are prepared and synchronized ahead of time to facilitate quick data acquisition.
Solution Approach 2:
The transceiver performs jitter measurement using its own internal resources - specifically, its internal clock signal generators and logic circuits - without requiring external measurement equipment. The device measures its own timing characteristics by comparing signals generated internally, thereby serving itself and eliminating the time-consuming external measurement process while maintaining accuracy.
2Measurement precision
If conventional external equipment is used for jitter measurement, then accurate timing characteristics are obtained, but device cost and complexity increase
Solution Approach 1:
The patent merges the jitter measurement function with the transceiver's existing internal logic circuits and clock signal generators. Instead of using separate external measurement equipment, the measurement capability is integrated into the transceiver itself by combining the clock signal generation, signal transmission, and timing analysis functions within a single device architecture. This reduces overall system complexity and eliminates the need for costly external instruments.
Solution Approach 2:
The transceiver is designed with multi-functionality, serving both as a communication device and as its own measurement instrument. The same logic circuits that handle normal signal processing are also used to perform jitter measurement and timing analysis. This universal approach allows the device to accomplish multiple functions - communication and self-diagnosis - without requiring dedicated separate equipment for each function.
3Reliability
If conventional measurement methods are used, then comprehensive timing analysis is possible, but productivity during production testing decreases
Solution Approach 1:
The patent enables continuous jitter measurement by maintaining internal clock signals and logic circuit operation throughout the measurement process. Unlike external methods that require stopping production flow for lengthy measurements, the internal system continuously monitors timing characteristics during normal device operation and production testing, thereby maintaining productive action without interruption while providing comprehensive timing analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables fast and cost-effective measurement of jitter and other timing characteristics within milliseconds, facilitating real-time testing during production without the need for external equipment.
Implementation Method 1
the second clock signal generator comprises a phase locked loop, where the phase locked loop is operative to receive the first clock signal from the first clock signal generator and is further operative to provide the second clock signal to the receiver of the transceiver
Data Source
AI summary
Disclosed are systems, apparatus, and methods for a self-contained timing and jitter measurement. In various embodiments, a device may include a first clock signal generator operative to provide a first clock signal to a transmitter of a transceiver, where the first clock signal operates at a first frequency. The device may further include a second clock signal generator operative to provide a second clock signal to a receiver of the transceiver, where the second clock signal operates at a second frequency, and where the receiver samples an output of the transmitter at a sampling rate determined by the second frequency. In some embodiments, the device may further include a logic circuit operative to receive an output signal from the receiver and further operative to determine an indication of jitter based on the received output signal.