Parallel Transceiver Modulation Error Measurement via Loop-Back
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Solution Overview
Problem
The integration of transmitters and receivers onto a single chip in wireless communication devices complicates parallel testing, as it does not reduce test time or cost, due to the need for separate precision receivers for each device under test.
Innovation Solution
A loop-back test configuration that uses a single precision source to measure both demodulation and modulation errors in transceivers, allowing for parallel testing of multiple devices without increasing the number of test instruments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If a single precision source is used to stimulate multiple transceivers in parallel, then test cost and test time are reduced, but the ability to measure modulation error of each transmitter is lost
Solution Approach 1:
The patent introduces a loop-back connection as an intermediary mechanism that allows the receiver to measure the transmitter's modulation error. The receiver compares the received signal against the expected signal based on the known test pattern, effectively using the receiver as a mediator to indirectly measure the transmitter's performance without requiring a separate precision receiver for each transmitter.
Solution Approach 2:
The transceiver's own receiver component is utilized to measure the modulation error of its transmitter. By using the receiver's demodulation capability and comparing it against the known test pattern, the system enables self-testing of the transmitter's modulation accuracy without requiring external precision measurement equipment for each transmitter.
2Measurement precision
If separate precision receivers are used for each transceiver, then modulation error can be measured accurately, but test cost and device complexity increase
Solution Approach 1:
The patent merges the measurement function into the transceiver itself by utilizing the receiver's existing components. Instead of requiring separate precision receivers for each transmitter, the system combines the transmitter, receiver, and measurement functionality into a single integrated unit, reducing the total number of test instruments needed.
Solution Approach 2:
The receiver is given multiple functions: it not only demodulates signals for normal operation but also serves as a measurement instrument to characterize the transmitter's modulation error. This multi-functionality eliminates the need for dedicated precision receivers, reducing test equipment complexity.
3Device complexity
If integration of transmitters and receivers onto a single chip is implemented, then cost, size, and power are reduced, but test access to functional blocks is reduced
Solution Approach 1:
The patent extracts the measurement functionality from external test equipment and places it within the transceiver's receiver component. By taking out the measurement capability and integrating it into the receiver, the system maintains test accessibility while preserving the benefits of chip-level integration.
Data Source
AI summary
A test system is capable of performing parallel modulation error measurement of transceivers using a loop-back configuration. Each transceiver includes a transmitter and a receiver. A signal generator generates a first modulated signal for input to the receivers of the transceivers. A tester is operable to measure a first demodulation error produced by the receiver in response to the first modulated signal and to measure a modulation error of the transmitter based on the first demodulation error and a second demodulation error. The second demodulation error is produced by the receiver in response to a second modulated signal generated by the transmitter and coupled from the transmitter to the receiver.