Transceiver Loopback Test Using Receiver Pads

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Solution Overview

Problem

Conventional transceiver testing methods face challenges such as low test coverage, poor performance at high frequencies, and the need for additional test circuits that occupy significant area, particularly in internal and full path internal loopback tests.

Innovation Solution

A loopback test method for a transceiver that utilizes a transmitter, receiver pads, multiplexers, receiver analog front end, clock data recovery de-serializer, and digital logic to perform loopback testing without a separate test circuit, using external voltages to generate and compare test target signals, ensuring higher test coverage and smoother testing at higher frequencies.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If internal loopback test method is used, then device complexity is reduced, but test coverage is insufficient

Engineering Contradiction:
Improvetest circuit complexityVSAvoidtest coverage
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The existing receiver pads and receiver front end are made to serve dual purposes: normal data reception and loopback test signal reception. By configuring the receiver to process both external data signals and internal loopback signals through the same physical path, the patent achieves comprehensive testing without adding dedicated test circuitry, thus maintaining low device complexity while improving test coverage

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Ease of operation

If conventional loopback test methods are used, then testing is simpler, but high frequency performance is poor

Engineering Contradiction:
Improvetesting simplicityVSAvoidhigh frequency test performance
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The transceiver uses its own receiver front end to process the loopback test signals, leveraging the already-optimized high-frequency reception capabilities of the receiver. This self-service approach allows the system to test itself at high frequencies without requiring separate test equipment or simplified test paths that would compromise high-frequency performance

Inventive Principle:
Principle #25Self-service

3Reliability

If full path internal loopback test circuit is added, then test coverage is improved, but area occupation increases

Engineering Contradiction:
Improvetest coverageVSAvoidtest circuit area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent makes the receiver pads and receiver front end multi-functional by configuring them to handle both normal operational signals and loopback test signals. This eliminates the need for separate dedicated test circuits, achieving full-path testing coverage while maintaining a compact layout without additional area occupation

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20240267138A1Transceiver and loopback test method for transceiver
Publication Date: 2024.08.08 SAMSUNG ELECTRONICS CO LTD
  • US20240267138A1 patent drawing
  • US20240267138A1 patent drawing
  • US20240267138A1 patent drawing

AI summary

A transceiver according to an aspect of the inventive concepts may include a transmitter, a first receiver pad configured to receive a first external voltage, a second receiver pad configured to receive a second external voltage, a receiver configured to generate a test target signal based on the first external voltage and the second external voltage, and a digital logic configured to perform a loopback test on a reception path of a data signal by transmitting the data signal and receiving the test target signal.