Transceiver built-in self-test
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The challenge in wireless communication devices is to efficiently test and maintain the performance of millimeter-wave transceivers within limited space, given the increasing complexity and cost associated with testing procedures and equipment, while ensuring accurate results without external equipment.
Innovation Solution
A transceiver integrated circuit substrate with built-in self-test circuitry, including a transmission-signal source, power amplifier, low-noise amplifier, feedback circuit, and controller, which allows for self-testing by providing a test signal and measuring it before or after amplification, thereby reducing testing time and cost without external equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional external testing equipment and procedures are used for transceiver testing, then measurement accuracy can be maintained, but production cost and testing time increase significantly
Solution Approach 1:
The transceiver is designed with built-in self-test circuitry that enables the device to test itself without external equipment. The test signal source generates test signals, the feedback circuit routes them through the transmit and receive paths, and the test signal measurements are performed internally, allowing the system to self-verify its functionality while reducing production costs and testing time
Solution Approach 2:
The feedback circuit serves dual purposes: during normal operation it provides feedback signals for transceiver functionality, and during testing it routes test signals from the test signal source through the transmit and receive paths to measurement points, enabling the same circuit to support both operational and testing functions
2Reliability
If power amplifier output is not inhibited during testing, then normal operation is maintained, but signal leakage occurs and measurement accuracy deteriorates
Solution Approach 1:
The controller inhibits the power amplifier output before or during the application of test signals to prevent signal leakage that would interfere with measurements. This preliminary action ensures that the test measurements at the first and second measurement points are not contaminated by amplified signals, thereby maintaining measurement accuracy
Data Source
AI summary
A method of self-testing a transceiver integrated circuit substrate includes: providing a test signal to a transmission line that is communicatively coupled, or selectively communicatively coupled, to an input of a power amplifier of a first transceiver subcircuit of the transceiver integrated circuit substrate; providing the test signal from the transmission line to an LNA of an LNA of a second transceiver subcircuit of the transceiver integrated circuit substrate; and measuring the test signal before amplification by the LNA, or after amplification by the LNA, or both.