Transceiver Circuit Test Module for Early Fault Detection
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Solution Overview
Problem
Current methods for testing transmitter-receiver circuits are costly and time-consuming due to the need for complex and expensive external test devices, which are not suitable for early detection of faulty circuits during the manufacturing process.
Innovation Solution
An independent test module integrated into the transmitter-receiver circuit allows for testing of transmission and reception modes without external devices, enabling simple and direct verification of functionality by electrically connecting and disconnecting the test module from the processing unit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external test devices are used to verify circuit characteristics, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The test function is extracted from the main transceiver circuit by implementing a separate test module that can be independently activated. This allows the testing capability to be removed from the production circuit without affecting normal operation, resolving the contradiction by separating measurement functions from operational functions.
Solution Approach 2:
A test module acts as an intermediary between external test equipment and the transceiver circuit under test. This intermediary provides standardized test interfaces and signal routing, enabling precise measurements without requiring complex direct connections to the circuit internals.
2Reliability
If complete circuit testing is performed at each manufacturing stage, then reliability is improved, but loss of time increases
Solution Approach 1:
The test module is integrated into the circuit during manufacturing but remains dormant until needed. This preliminary preparation allows rapid activation of testing capabilities at any manufacturing stage without requiring setup time, enabling quick functionality verification that doesn't slow down production.
Solution Approach 2:
The test module can perform selective testing of specific circuit functions rather than requiring complete comprehensive testing at each stage. This partial action approach verifies critical functionalities quickly while deferring less critical tests, reducing overall testing time while maintaining reliability.
3Adaptability or versatility
If versatile test devices are used to test all characteristics, then adaptability is improved, but device complexity increases
Solution Approach 1:
The testing capability is segmented into a separate test module rather than being integrated into the main transceiver circuit. This segmentation allows the test functions to be independently designed and activated only when needed, providing versatility without adding complexity to the production circuit.
Solution Approach 2:
The test module can be electrically disconnected after manufacturing testing is complete, effectively discarding the temporary testing infrastructure. This allows the circuit to be delivered in its clean production state without permanent test equipment attachments, maintaining simplicity while providing temporary versatility during manufacturing.
4Ease of operation
If test module is permanently integrated into the circuit, then ease of operation is improved, but device complexity increases
Solution Approach 1:
The test module connection is made dynamic rather than static - it can be electrically connected when testing is needed and disconnected when not needed. This dynamic configuration provides ease of operation during testing while maintaining circuit simplicity for production, resolving the contradiction between operational ease and structural complexity.
Solution Approach 2:
The test module is temporarily integrated during manufacturing and then discarded (electrically disconnected) before product delivery. This temporary integration provides ease of operation for testing purposes without permanently increasing the complexity of the final product circuit.
Data Source
Figure 1~3
AI summary
The method involves electrically connecting a test module (2) to the processing unit (7) of the transmitter-receiver circuit (1), testing the operation of the transmitter-receiver circuit in a first operating mode, which can be either a data transmission mode or a data reception mode, using the test module, testing the operation of the transmitter-receiver circuit in a second operating mode, which can be either a data reception mode or a data transmission mode, using the test module, and electrically disconnecting the test module from the processing unit. An independent claim is also included for a test module for a transmitter-receiver circuit.