Transducer Interface Impedance Matching for Accurate Time-of-Flight

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Solution Overview

Problem

Ultrasonic transducers face accuracy issues when their impedance characteristics change due to configuration interchange, leading to degraded signal quality and measurement inaccuracies, particularly due to temperature fluctuations and aging.

Innovation Solution

The implementation of a self-calibrating system that matches the impedances of output transistors between different configurations of ultrasonic drivers using programmable-finger transistors, allowing for iterative measurement and programming to adjust drive strengths and ensure reciprocity between transmitter and receiver roles, thereby compensating for impedance differences.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If transducers are configured to operate as both transmitters and receivers, then versatility is improved, but measurement precision deteriorates due to impedance variations

Engineering Contradiction:
Improvetransducer configuration flexibilityVSAvoidmeasurement accuracy
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the impedance characteristics of output transistors through programmable-finger transistor arrays. The system measures impedance in one configuration and programs complementary metal-oxide-semiconductor (CMOS) circuits to compensate for impedance differences when switching between transmitter and receiver modes, thereby maintaining measurement precision across configuration changes.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If transducers operate over extended periods, then productivity is improved, but reliability deteriorates due to aging effects on impedance characteristics

Engineering Contradiction:
Improvecontinuous operation capabilityVSAvoidimpedance stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements feedback by continuously measuring the impedance of output transistors during operation and using these measurements to program compensating impedance values in CMOS circuits. This closed-loop feedback mechanism counteracts aging effects and maintains reliable operation over extended periods by dynamically adjusting transistor finger configurations based on real-time impedance measurements.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If impedance matching is performed through programmable-finger transistors, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveimpedance matching accuracyVSAvoidcircuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing the output transistor structure into multiple programmable-finger segments. Each finger can be independently controlled through CMOS switching circuits, allowing precise impedance matching by selectively enabling or disabling individual fingers. This segmented approach provides fine-grained control over impedance characteristics while using standard CMOS fabrication processes.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS11247232B2Transducer interface pair impedance measurement
Publication Date: 2022.02.15 TEXAS INSTRUMENTS INC
  • US11247232B2 patent drawing
  • US11247232B2 patent drawing
  • US11247232B2 patent drawing

AI summary

In described examples, a first and second driver each include a first-rail output transistor including a first terminal coupled to a first power rail and a second-rail output transistor including a first terminal coupled to a second power rail. The first-rail output transistor of each of the first and second drivers includes a second terminal coupled to a second terminal of the second-rail output transistor of an output node of each respective first and second driver. A resistive load includes a first terminal coupled to the first-driver output node and includes a second terminal coupled to the second-driver output node. A sampling circuit generates an indication of an impedance of at least one of the output transistors of the first and second drivers.