Transfer Apparatus Vacuum Segmentation for Electronic Device Handling
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Solution Overview
Problem
Conventional test handlers in the semiconductor industry face issues with 'piggybacking' where adjacent electronic devices overlap, preventing effective transfer due to residual vacuum forces and lack of mechanisms to create gaps between packages.
Innovation Solution
A transfer apparatus with first and second vacuum passages and sensors to maintain separation between electronic devices, along with an ejector to assist in removing packages from the conveying track, ensuring efficient transfer without overlapping.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single vacuum passage is used to hold electronic devices on the conveying track, then the device structure is simple, but adjacent electronic devices overlap causing piggybacking and pickup failure
Solution Approach 1:
The single vacuum passage is divided into multiple independent vacuum passages (first vacuum passage and second vacuum passage), each controlling a specific position on the conveying track. This segmentation allows independent vacuum control at different locations, preventing adjacent electronic devices from overlapping while maintaining reliable pickup operation.
2Manufacturing precision
If vacuum force is applied to hold electronic devices in place, then pickup accuracy is improved, but residual vacuum force prevents timely release and reduces transfer speed
Solution Approach 1:
The ejector is activated in advance to push the electronic device away from the vacuum passage before the vacuum force is completely released. This preliminary action overcomes the residual vacuum force and ensures timely release of the electronic device, maintaining both pickup accuracy and transfer speed.
3Productivity
If electronic devices are conveyed closely together to increase feeding rate, then productivity is improved, but piggybacking occurs causing pickup failures
Solution Approach 1:
Multiple vacuum passages are positioned at different locations along the conveying track, allowing electronic devices to be held at separated intervals. This enables closely spaced devices to be conveyed without overlapping, maintaining both high feeding rate and reliable pickup operation.
Solution Approach 2:
Sensors detect the position of electronic devices on the conveying track and provide feedback to the control system. Based on this feedback, the vacuum passages are activated or deactivated to maintain proper spacing between devices, preventing piggybacking while maximizing feeding rate.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents 'piggybacking' by maintaining a gap between electronic devices and allows for immediate pickup by the suction device, enhancing the transfer rate and efficiency compared to conventional systems.
Implementation Method 1
first and second vacuum passages being operative to create vacuum forces to hold electronic devices against the conveying track
Implementation Method 2
a suction force from the suction device holds the leading electronic package and transfers it from the feeder to a testing apparatus
Data Source
AI summary
A transfer apparatus has a conveying track for electronic devices in a row, two vacuum passages to create vacuum forces to hold electronic devices against the conveying track at first and second positions respectively preventing overlapping of electronic devices; and sensors arranged with respect to the conveying track, the first sensor detects presence or absence of the leading electronic device at the first position for removal of the leading electronic device from the conveying track, and the second sensor detects presence or absence of the leading electronic device at a sensor position between the first and second positions as the leading electronic device is conveyed along the conveying track from the second to the first vacuum passage.