Transformer Testing Device Switching Matrix

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Solution Overview

Problem

Existing transformer testing devices face inefficiencies and increased labor and time expenditures when testing three-phase transformers, particularly due to the need for redistribution wirings and the risk of faulty connections with external units.

Innovation Solution

A transformer testing device equipped with a switching matrix that allows for the selective combination of multiple sources to generate test signals with increased voltage or current amplitudes, enabling flexible and efficient testing without additional redistribution wirings by connecting sources in series or parallel configurations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If redistribution wirings are implemented to achieve flexibility in testing, then adaptability is improved, but device complexity and labor expenditure increase

Engineering Contradiction:
Improveflexibility in testingVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The switching matrix provides a universal interface that can connect any test signal source to any transformer phase through programmable switching, eliminating the need for physical redistribution wirings. The same hardware configuration can perform multiple different test configurations through software control, achieving adaptability without increasing physical complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If external units are connected to increase test signal amplitude, then measurement precision is improved, but reliability deteriorates due to faulty connections

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidconnection reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

Multiple test signal sources are merged within the integrated switching matrix to generate higher amplitude test signals. Instead of connecting external units that risk faulty connections, the system combines multiple internal sources through the switching matrix, achieving the same measurement precision improvement while maintaining reliable internal connections.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If multiple sources are combined to increase test signal amplitude, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The switching matrix acts as an intermediary that manages the combination of multiple test signal sources. It provides a systematic way to connect sources in series or parallel configurations through programmable switching, achieving increased test signal amplitude and measurement precision while maintaining manageable device complexity through automated control.

Inventive Principle:
Principle #24Intermediary (Mediator)

4Adaptability or versatility

If redistribution wirings are used for different measurements, then adaptability is improved, but loss of time increases due to reconfiguration

Engineering Contradiction:
Improvetest configuration flexibilityVSAvoidreconfiguration time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The switching matrix enables dynamic reconfiguration of test signal paths through programmable switching. Instead of static physical redistributions that require time-consuming manual reconfiguration, the system can dynamically change connection topologies through software control, maintaining adaptability while eliminating reconfiguration time losses.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS10914778B2Transformer testing device, and method for testing a transformer
Publication Date: 2021.02.09 OMICRON ELECTRONICS GMBH
  • US10914778B2 patent drawing
  • US10914778B2 patent drawing
  • US10914778B2 patent drawing

AI summary

A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).