Transient Edge Clipper Circuit for Picosecond Timing Measurement
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Solution Overview
Problem
Conventional methods for measuring transient time in electronic devices are limited by oscilloscope bandwidth and capacitance loads, leading to inaccurate measurements.
Innovation Solution
A monitoring circuit that uses a transient edge clipper circuit, logic circuitry, and converter circuit to convert transient time into an output current, allowing for real-time monitoring with adjustable thresholds and high accuracy, independent of oscilloscope bandwidth limitations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an oscilloscope is used to measure transient time with high accuracy, then the measurement precision is improved, but the device complexity and capacitance load increase
Solution Approach 1:
The patent extracts the transient time measurement function from the complex oscilloscope system and implements it using a dedicated monitoring circuit with transient edge clipper, logic circuitry, and converter circuit. This specialized circuit measures transient time by detecting voltage transitions and generating corresponding output signals, eliminating the need for complex oscilloscope equipment while maintaining measurement accuracy.
Solution Approach 2:
The patent creates a simplified model of the measurement process by using the monitoring circuit to replicate the essential measurement function. Instead of using the full oscilloscope system, the patent implements a copy of the measurement capability through dedicated circuitry that generates output signals proportional to transient time, achieving the same measurement goal with reduced complexity.
2Measurement precision
If an oscilloscope with greater bandwidth is used to detect signals accurately, then the measurement precision is improved, but the cost and device complexity increase
Solution Approach 1:
The patent extracts the high-precision measurement capability from expensive high-bandwidth oscilloscopes and implements it through a dedicated monitoring circuit. The circuit uses transient edge clipping and logic circuitry to achieve accurate transient time measurement without requiring the complex high-bandwidth infrastructure of traditional oscilloscopes.
Solution Approach 2:
The patent replaces expensive, complex oscilloscope equipment with a simpler, more cost-effective monitoring circuit. The dedicated circuit provides the necessary measurement precision at a lower cost and with reduced complexity, making high-precision transient time measurement accessible without investing in expensive test equipment.
3Ease of operation
If conventional oscilloscope methods are used to measure transient time, then the measurement process is simple, but the measurement precision deteriorates due to capacitance load
Solution Approach 1:
The patent introduces a monitoring circuit as an intermediary between the device under test and the measurement system. This intermediate circuit actively compensates for capacitance load effects by using transient edge clipping and active driving, thereby maintaining signal integrity and measurement precision while keeping the measurement process simple and integrated.
4Measurement precision
If a circuit-based monitoring approach is used instead of oscilloscope, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The patent segments the monitoring function into distinct modular components: a transient edge clipper circuit for voltage level detection, logic circuitry for signal processing, and a converter circuit for output generation. This segmentation allows each component to perform its specific function efficiently, improving measurement precision while organizing the complexity into manageable, functional modules.
Data Source
AI summary
Devices and methods are provided for monitoring a transient time in a device under test. A circuit includes a transient edge clipper circuit electrically coupled to the device under test. The transient edge clipper circuit is configured to remove voltage levels of a voltage waveform of the device under test which exceed a threshold range to generate a clipped voltage waveform. The circuit also includes logic circuitry electrically coupled to the transient edge clipper circuit. The logic circuitry is configured to generate a time delayed pulse signal representation of the clipped voltage waveform by injecting a predetermined time delay. The circuit also includes a converter circuit electrically coupled to the logic circuitry. The converter circuit is configured to generate a current signal based on the pulse signal representations.