Transistor Parameter Variation Estimation for Voltage Optimization

The patent applies preliminary action by measuring transistor parameter variations (such as delay and leakage current) before operating the integrated circuit. These measurements are performed during manufacturing or initialization, and the results are stored for later use. This allows the system to determine an optimized supply voltage level that avoids timing violations without requiring real-time monitoring, thereby enabling lower power consumption while maintaining reliability.

The patent utilizes parameter changes by adjusting the supply voltage level based on measured transistor characteristics. Instead of using a fixed conservative voltage threshold, the system modifies the operating parameters (voltage, delay, leakage current) according to the actual transistor variations. This enables the circuit to operate at lower voltages when transistor variations permit, reducing power consumption while avoiding timing violations.

The patent implements feedback by using measured transistor parameter data to determine the actual supply voltage threshold required for proper operation. The measurement results feed into a calculation or lookup process that establishes an optimized voltage threshold specific to each integrated circuit or even each transistor. This feedback mechanism replaces conservative fixed thresholds with data-driven dynamic thresholds, eliminating unnecessary voltage headroom and reducing power waste while ensuring proper functionality.

The patent applies preliminary action by performing transistor parameter measurements and determining the optimized supply voltage threshold before the integrated circuit enters normal operation. This preliminary characterization allows the system to configure the operating parameters in advance, eliminating the need to use conservative voltage margins during actual operation and thereby reducing power consumption without compromising functionality.

The patent applies self-service by enabling the integrated circuit to characterize its own transistor parameters through built-in measurement mechanisms. The circuit performs self-diagnosis by measuring delay and leakage current of its own transistors, eliminating the need for external complex testing equipment. This self-characterization capability allows the system to optimize its own operating parameters, achieving power efficiency without adding significant external complexity.

The patent uses preliminary action by performing transistor parameter measurements during manufacturing or initialization phases, before the circuit enters production use. These preliminary measurements capture transistor variations once, and the results are stored for ongoing operation. This approach avoids the need for continuous complex measurements during operation, balancing the need for parameter knowledge with device complexity constraints.