Transistor Temperature Detection Units for Semiconductor Circuits

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Solution Overview

Problem

Semiconductor integrated circuits face challenges in maintaining normal functioning due to characteristic changes in elements at extreme temperatures, as existing technologies lack effective means to cope with these changes.

Innovation Solution

An apparatus using transistors with selectively active temperature detecting units that generate different signals according to predetermined temperature intervals, including pulse widths and voltage levels, to actively manage and detect temperature conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If semiconductor integrated circuits are used in extreme temperature conditions, then the operating range is expanded, but the characteristic changes of elements cause malfunction

Engineering Contradiction:
Improveoperating temperature rangeVSAvoidcircuit functioning stability
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The temperature detection system is divided into multiple detection units, each responsible for detecting a specific temperature range. Each unit contains transistors configured to detect temperature within its designated interval, allowing the system to cover a wide temperature range while maintaining accurate detection at each segment.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention changes the operational parameters of transistors by configuring them with different threshold voltages and current characteristics. By adjusting the gate-source voltage and drain current parameters of individual transistors, each detection unit responds to specific temperature intervals, enabling the system to adapt to extreme temperature conditions while maintaining reliable operation.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If temperature detection accuracy is improved, then temperature control is enhanced, but the complexity of detection units increases

Engineering Contradiction:
Improvetemperature detection accuracyVSAvoiddetection unit structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Each temperature detection unit uses a standardized transistor-based structure that can detect temperature across different intervals. The same basic circuit topology is reused for each temperature range, with only the transistor parameters being adjusted. This universal design reduces overall system complexity while maintaining detection accuracy across multiple temperature intervals.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS8210744B2Apparatus for detecting temperature using transistors
Publication Date: 2012.07.03 SK HYNIX INC
  • US8210744B2 patent drawing
  • US8210744B2 patent drawing
  • US8210744B2 patent drawing

AI summary

An apparatus for detecting a temperature using transistors includes a plurality of temperature detecting units that become selectively active according to predetermined temperature intervals; and a detection signal output unit that generates detection signals according to the signals transmitted by the plurality of temperature detecting units, and outputs the detection signals.