Transistor Junction Temperature Sensing via Control Terminal Voltage

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Solution Overview

Problem

Existing methods for measuring the temperature of a transistor, such as junction temperature, are imprecise due to delays and inaccuracies when using temperature sensors on the package, which do not accurately reflect the transistor's temperature.

Innovation Solution

A method involving providing a current pulse of predefined length and magnitude to the transistor's control terminal, measuring the voltage at that terminal, and determining the transistor's temperature based on the measured voltage, using a transistor driver device with a driver circuit, voltage measurement device, and evaluation device to calculate the temperature.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a temperature sensor is placed on the package, then the temperature can be measured, but the measurement is delayed and imprecise due to thermal conduction delays through the package

Engineering Contradiction:
Improvetemperature measurement precisionVSAvoidtemperature measurement delay
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent uses an electrical signal (voltage measurement during current pulse) as an intermediary to indirectly determine transistor temperature without physically contacting the junction. The voltage response during a current pulse serves as a mediator that correlates to temperature through the transistor's electrical characteristics, bypassing the need for thermal conduction through the package.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the mechanical/thermal measurement system (physical temperature sensor contacting the package) with an electrical measurement system. Instead of measuring temperature directly through thermal conduction, the system applies electrical current pulses and measures voltage responses, substituting thermal measurement with electrical characteristic analysis.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If a package-based temperature sensor is used, then temperature measurement is possible, but the sensor does not accurately reflect the transistor's actual temperature

Engineering Contradiction:
Improvetemperature measurement accuracyVSAvoidtransistor temperature reflection accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The voltage response during current pulse application serves as an intermediary that directly reflects the transistor junction's electrical characteristics, which are temperature-dependent. This electrical mediator provides a more accurate representation of the actual junction temperature compared to package-level thermal sensors.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The transistor itself serves as the sensing element by utilizing its own electrical characteristics (voltage response to current pulse) that inherently change with temperature. The device being measured performs the measurement function through its own temperature-dependent electrical properties, eliminating the need for separate package sensors.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Accurately determines the transistor's temperature by measuring the voltage during a current pulse, providing precise temperature estimation without the delays and inaccuracies of package-based sensors.

Implementation Method 1

measuring a voltage at the control terminal... and determining the temperature of the transistor based on the measured voltage

Methodology Applied
Scientific EffectTemperature-dependent electrical characteristics:

Data Source

PatentUS20250364348A1Method of determining a temperature of a transistor, transistor driver device and system
Publication Date: 2025.11.27 INFINEON TECH AUSTRIA AG
  • US20250364348A1 patent drawing
  • US20250364348A1 patent drawing
  • US20250364348A1 patent drawing

AI summary

A method of determining a temperature of a transistor is provided. The method includes providing a current pulse of a predefined length and a predefined current magnitude to a control terminal of the transistor, and measuring a voltage at the control terminal. The temperature of the transistor is then determined based on the measured voltage.