Transition Detector Timing Window for Reliable Edge Capture
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Solution Overview
Problem
Existing transition detectors face timing-contention issues, leading to missed transitions and errors due to sensitive timing requirements and physical implementation variations, making them unsuitable for circuits sensitive to errors.
Innovation Solution
A transition detector with clock-pulse-generation and data-pulse-generation circuitry, including programmable delays to ensure data pulses overlap with clock pulses within a specified window, along with a self-test mode for manufacturing fault detection and tunable window sizes for various applications.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a level-sensitive approach is used in transition detector design, then the circuit operation is simplified, but transitions are missed leading to detection errors
Solution Approach 1:
The patent employs edge-triggered flip-flops that operate on periodic clock edges rather than continuous level-sensitive monitoring. The detection mechanism is activated periodically at clock edges, ensuring reliable transition detection without the complexity of continuous level-sensitive circuit operation. This periodic sampling approach maintains reliability while managing operational complexity.
Solution Approach 2:
The patent introduces intermediate signals and circuit stages between the data input and detection output. Multiple flip-flops and signal processing stages act as intermediaries to ensure that transitions are properly captured and propagated, preventing missed detections while maintaining a structured approach to circuit operation.
2Device complexity
If fixed timing parameters are used in transition detector, then the design is simplified, but the detector cannot adapt to different applications and timing requirements
Solution Approach 1:
The patent implements programmable delay elements that can be configured to different timing values, allowing the detection window to be dynamically adjusted. The delay amount can be programmed to match different clock periods and timing requirements of various applications, providing adaptability without requiring complete redesign for each application.
Solution Approach 2:
The patent allows modification of key timing parameters such as the detection window width and delay values through programming. By changing these parameters, the same detector circuit can adapt to different clock frequencies, data rates, and timing requirements, achieving versatility while maintaining a unified design structure.
3Device complexity
If no self-test mechanism is implemented, then the device complexity is reduced, but manufacturing faults cannot be detected
Solution Approach 1:
The patent incorporates a self-test mode that allows the detector to test its own functionality. In this mode, the circuit generates test patterns internally and verifies its own detection capability, enabling fault detection without requiring external test equipment. This self-service approach maintains reliability while adding only moderate complexity.
Solution Approach 2:
The patent includes preliminary testing capability that can be performed during manufacturing or before deployment. The self-test mechanism allows faults to be detected in advance, ensuring that only functional detectors are deployed in final applications, thereby improving overall system reliability.
Data Source
AI summary
An embodiment of a detector includes first and second generators. The first generator is operable to receive a transition of a first signal and to generate in response to the transition a first pulse having a length that is approximately equal to a length of a detection window. And the second generator is operable to receive a second signal and to generate a second pulse having a relationship to the first pulse in response to a transition of the second signal occurring approximately during the detection window.